• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4608651)   Today's Articles (594)   Subscriber (49377)
For:  [Subscribe] [Scholar Register]
Number Cited by Other Article(s)
1
Ralph B. Applications of electron microscopy in materials science and technology (microscopy in the modern world)*. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1989.tb02895.x] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/01/2022]
2
Randle V, Ralph B. Applications of Grain Boundary Engineering to Anomalous Grain Growth. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-122-419] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
3
Representation of grain misorientations (mesotexture) in Rodrigues-Frank space. ACTA ACUST UNITED AC 1997. [DOI: 10.1098/rspa.1990.0118] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
4
Crawford DC, Was GS. Grain boundary character distributions in Ni-16Cr-9Fe using selected area channeling patterns: methodology and results. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE 1991;19:345-60. [PMID: 1795187 DOI: 10.1002/jemt.1060190309] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/28/2022]
5
Randle V. Early stages of recrystallization in nickel. ACTA ACUST UNITED AC 1990. [DOI: 10.1007/bf02647883] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
6
Randle V, Barker I, Ralph B. Measurement of lattice parameter and strain using convergent beam electron diffraction. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE 1989;13:51-65. [PMID: 2674367 DOI: 10.1002/jemt.1060130108] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/02/2023]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA