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Anada S, Nomura Y, Yamamoto K. Enhancing performance of electron holography with mathematical and machine learning-based denoising techniques. Microscopy (Oxf) 2023; 72:461-484. [PMID: 37428597 DOI: 10.1093/jmicro/dfad037] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/28/2023] [Revised: 06/13/2023] [Accepted: 07/09/2023] [Indexed: 07/12/2023] Open
Abstract
Electron holography is a useful tool for analyzing functional properties, such as electromagnetic fields and strains of materials and devices. The performance of electron holography is limited by the 'shot noise' inherent in electron micrographs (holograms), which are composed of a finite number of electrons. A promising approach for addressing this issue is to use mathematical and machine learning-based image-processing techniques for hologram denoising. With the advancement of information science, denoising methods have become capable of extracting signals that are completely buried in noise, and they are being applied to electron microscopy, including electron holography. However, these advanced denoising methods are complex and have many parameters to be tuned; therefore, it is necessary to understand their principles in depth and use them carefully. Herein, we present an overview of the principles and usage of sparse coding, the wavelet hidden Markov model and tensor decomposition, which have been applied to electron holography. We also present evaluation results for the denoising performance of these methods obtained through their application to simulated and experimentally recorded holograms. Our analysis, review and comparison of the methods clarify the impact of denoising on electron holography research.
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Affiliation(s)
- Satoshi Anada
- Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, Aichi 456-8587, Japan
| | - Yuki Nomura
- Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, Aichi 456-8587, Japan
| | - Kazuo Yamamoto
- Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, Aichi 456-8587, Japan
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Taurino A, Carlino E. The Relevance of Building an Appropriate Environment around an Atomic Resolution Transmission Electron Microscope as Prerequisite for Reliable Quantitative Experiments: It Should Be Obvious, but It Is a Subtle Never-Ending Story! MATERIALS (BASEL, SWITZERLAND) 2023; 16:1123. [PMID: 36770131 PMCID: PMC9953716 DOI: 10.3390/ma16031123] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/25/2022] [Revised: 01/02/2023] [Accepted: 01/19/2023] [Indexed: 06/18/2023]
Abstract
The realization of electron microscopy facilities all over the world has experienced a paramount increase in the last decades. This means huge investments of public and private money due to the high costs of equipment, but also for maintenance and running costs. The proper design of a transmission electron microscopy facility is mandatory to fully use the advanced performances of modern equipment, capable of atomic resolution imaging and spectroscopies, and it is a prerequisite to conceive new methodologies for future advances of the knowledge. Nonetheless, even today, in too many cases around the world, the realization of the environment hosting the equipment is not appropriate and negatively influences the scientific quality of the results during the life of the infrastructure, practically vanishing the investment made. In this study, the key issues related to the realization of an advanced electron microscopy infrastructure are analyzed based on personal experience of more than thirty years, and on the literature.
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Affiliation(s)
- Antonietta Taurino
- Institute for Microelectronics and Microsystems, National Research Council of Italy (CNR), Via Monteroni, 73100 Lecce, Italy
| | - Elvio Carlino
- Institute of Crystallography, National Research Council of Italy (CNR), Via Giovanni Amendola 122/O, 70126 Bari, Italy
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Kawasaki T, Takahashi Y, Tanigaki T. Holography: application to high-resolution imaging. Microscopy (Oxf) 2021; 70:39-46. [PMID: 32991687 DOI: 10.1093/jmicro/dfaa050] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/12/2020] [Revised: 08/19/2020] [Accepted: 09/01/2020] [Indexed: 11/13/2022] Open
Abstract
Electron holography was invented for correcting aberrations of the lenses of electron microscopes. It was used to observe the atomic arrangements in crystals after decades of research. Then it was combined with a hardware aberration corrector to enable high-resolution and high-precision analysis. Its applications were further extended to magnetic observations with sub-nanometer resolution. High-resolution electron holography has become a powerful technique for observing electromagnetic distributions in functional materials.
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Affiliation(s)
- Takeshi Kawasaki
- Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, 350-0395, Japan
| | - Yoshio Takahashi
- Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, 350-0395, Japan
| | - Toshiaki Tanigaki
- Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, 350-0395, Japan
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Cho Y, Lee S, Murakami Y. Magnetic flux density measurements from narrow grain boundaries produced in sintered permanent magnets. Microscopy (Oxf) 2021; 70:17-23. [PMID: 32572498 DOI: 10.1093/jmicro/dfaa032] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/18/2020] [Revised: 06/11/2020] [Accepted: 06/19/2020] [Indexed: 11/13/2022] Open
Abstract
This review examines methods of magnetic flux density measurements from the narrow grain boundary (GB) regions, the thickness of which is of the order of nanometers, produced in Nd-Fe-B-based sintered magnets. Despite of the complex crystallographic microstructure and the significant stray magnetic field of the sintered magnet, recent progress in electron holography allowed for the determination of the intrinsic magnetic flux density due to the GB which is embedded in the polycrystalline thin-foil. The methods appear to be useful as well for intensive studies about interface magnetism in a variety of systems.
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Affiliation(s)
- Youngji Cho
- The Ultramicroscopy Research Center, Kyushu University, Fukuoka 819-0395, Japan
| | - Sujin Lee
- Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
| | - Yasukazu Murakami
- The Ultramicroscopy Research Center, Kyushu University, Fukuoka 819-0395, Japan.,Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan
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Investigation of gas-electron interactions with electron holography. Ultramicroscopy 2020; 221:113178. [PMID: 33302046 DOI: 10.1016/j.ultramic.2020.113178] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/20/2020] [Revised: 11/20/2020] [Accepted: 11/21/2020] [Indexed: 11/20/2022]
Abstract
Using the combination of off-axis electron holography and environmental Transmission Electron Microscopy (TEM), an experimental setup termed 'gas electron holography', we investigate how the presence of gas in the microscope affects the spatial and phase resolution of electron holograms. The gas is introduced either by using an Environmental TEM (ETEM) or a closed-cell holder. The ETEM data on gas electron holography shows that the number of electrons reaching the detector decreases exponentially as a function of gas pressure. From this evidence, we construct a phenomenological model that describes how coherency changes as a function of gas pressure. By linking the model with the concept of inelastic scattering cross section we find that the change in the coherency of the electron beam due to the presence of gas is related to the number of gas molecules present, their atomic weight and the average energy lost due to inelastic scattering. Regarding gas electron holography with a closed cell holder, we conclude that the membranes surrounding the gas are the primary factor in determining the quality of the electron hologram, while the gas pressure inside the cell has a small impact on the spatial and phase resolution of the electron holograms.
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Adaniya H, Cheung M, Cassidy C, Yamashita M, Shintake T. Development of a SEM-based low-energy in-line electron holography microscope for individual particle imaging. Ultramicroscopy 2018; 188:31-40. [PMID: 29544194 DOI: 10.1016/j.ultramic.2018.03.002] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/16/2017] [Revised: 01/29/2018] [Accepted: 03/02/2018] [Indexed: 10/17/2022]
Abstract
A new SEM-based in-line electron holography microscope has been under development. The microscope utilizes conventional SEM and BF-STEM functionality to allow for rapid searching of the specimen of interest, seamless interchange between SEM, BF-STEM and holographic imaging modes, and makes use of coherent low-energy in-line electron holography to obtain low-dose, high-contrast images of light element materials. We report here an overview of the instrumentation and first experimental results on gold nano-particles and carbon nano-fibers for system performance tests. Reconstructed images obtained from the holographic imaging mode of the new microscope show substantial image contrast and resolution compared to those acquired by SEM and BF-STEM modes, demonstrating the feasibility of high-contrast imaging via low-energy in-line electron holography. The prospect of utilizing the new microscope to image purified biological specimens at the individual particle level is discussed and electron optical issues and challenges to further improve resolution and contrast are considered.
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Affiliation(s)
- Hidehito Adaniya
- Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Okinawa 904-0495, Japan.
| | - Martin Cheung
- Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Okinawa 904-0495, Japan
| | - Cathal Cassidy
- Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Okinawa 904-0495, Japan
| | - Masao Yamashita
- Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Okinawa 904-0495, Japan
| | - Tsumoru Shintake
- Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Okinawa 904-0495, Japan
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Cantu-Valle J, Ruiz-Zepeda F, Mendoza-Santoyo F, Jose-Yacaman M, Ponce A. Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope. Ultramicroscopy 2014; 147:44-50. [PMID: 25016585 DOI: 10.1016/j.ultramic.2014.06.003] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/03/2014] [Revised: 05/16/2014] [Accepted: 06/14/2014] [Indexed: 11/28/2022]
Abstract
In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35nm to 2.5μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.
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Affiliation(s)
- Jesus Cantu-Valle
- Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA
| | - Francisco Ruiz-Zepeda
- Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA
| | - Fernando Mendoza-Santoyo
- Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA
| | - Miguel Jose-Yacaman
- Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA
| | - Arturo Ponce
- Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA.
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Avilov AS, Gubin SP, Zaporozhets MA. Electron crystallography as an informative method for studying the structure of nanoparticles. CRYSTALLOGR REP+ 2013. [DOI: 10.1134/s1063774513060059] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]
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Linck M. Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEM. Ultramicroscopy 2013; 124:77-87. [DOI: 10.1016/j.ultramic.2012.08.006] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/09/2012] [Revised: 08/10/2012] [Accepted: 08/14/2012] [Indexed: 10/28/2022]
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Linck M, Freitag B, Kujawa S, Lehmann M, Niermann T. State of the art in atomic resolution off-axis electron holography. Ultramicroscopy 2012. [DOI: 10.1016/j.ultramic.2012.01.019] [Citation(s) in RCA: 32] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/28/2022]
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Imaging from atomic structure to electronic structure. Micron 2012. [DOI: 10.1016/j.micron.2011.10.024] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
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Dark-field electron holography for the measurement of geometric phase. Ultramicroscopy 2011; 111:1328-37. [PMID: 21864773 DOI: 10.1016/j.ultramic.2011.04.008] [Citation(s) in RCA: 50] [Impact Index Per Article: 3.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/28/2010] [Revised: 04/19/2011] [Accepted: 04/24/2011] [Indexed: 11/20/2022]
Abstract
The genesis, theoretical basis and practical application of the new electron holographic dark-field technique for mapping strain in nanostructures are presented. The development places geometric phase within a unified theoretical framework for phase measurements by electron holography. The total phase of the transmitted and diffracted beams is described as a sum of four contributions: crystalline, electrostatic, magnetic and geometric. Each contribution is outlined briefly and leads to the proposal to measure geometric phase by dark-field electron holography (DFEH). The experimental conditions, phase reconstruction and analysis are detailed for off-axis electron holography using examples from the field of semiconductors. A method for correcting for thickness variations will be proposed and demonstrated using the phase from the corresponding bright-field electron hologram.
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Cockayne D, Kirkland AI, Nellist PD, Bleloch A. New possibilities with aberration-corrected electron microscopy. PHILOSOPHICAL TRANSACTIONS. SERIES A, MATHEMATICAL, PHYSICAL, AND ENGINEERING SCIENCES 2009; 367:3633-3635. [PMID: 19687057 DOI: 10.1098/rsta.2009.0135] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
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