Antognini A, Crivelli P, Prokscha T, Khaw KS, Barbiellini B, Liszkay L, Kirch K, Kwuida K, Morenzoni E, Piegsa FM, Salman Z, Suter A. Muonium emission into vacuum from mesoporous thin films at cryogenic temperatures.
PHYSICAL REVIEW LETTERS 2012;
108:143401. [PMID:
22540791 DOI:
10.1103/physrevlett.108.143401]
[Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/23/2011] [Indexed: 05/31/2023]
Abstract
We report on muonium (Mu) emission into vacuum following μ(+) implantation in mesoporous thin SiO(2) films. We obtain a yield of Mu into vacuum of (38±4)% at 250 K and (20±4)% at 100 K for 5 keV μ(+) implantation energy. From the implantation energy dependence of the Mu vacuum yield we determine the Mu diffusion constants in these films: D(Mu)(250 K)=(1.6±0.1)×10(-4) cm(2)/s and D(Mu)(100 K)=(4.2±0.5)×10(-5) cm(2)/s. Describing the diffusion process as quantum mechanical tunneling from pore to pore, we reproduce the measured temperature dependence ∼T(3/2) of the diffusion constant. We extract a potential barrier of (-0.3±0.1) eV which is consistent with our computed Mu work function in SiO(2) of [-0.3,-0.9] eV. The high Mu vacuum yield, even at low temperatures, represents an important step toward next generation Mu spectroscopy experiments.
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