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Renna LA, Bag M, Gehan TS, Han X, Lahti PM, Maroudas D, Venkataraman D. Tunable Percolation in Semiconducting Binary Polymer Nanoparticle Glasses. J Phys Chem B 2016; 120:2544-56. [PMID: 26854924 DOI: 10.1021/acs.jpcb.5b11716] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
Binary polymer nanoparticle glasses provide opportunities to realize the facile assembly of disparate components, with control over nanoscale and mesoscale domains, for the development of functional materials. This work demonstrates that tunable electrical percolation can be achieved through semiconducting/insulating polymer nanoparticle glasses by varying the relative percentages of equal-sized nanoparticle constituents of the binary assembly. Using time-of-flight charge carrier mobility measurements and conducting atomic force microscopy, we show that these systems exhibit power law scaling percolation behavior with percolation thresholds of ∼24-30%. We develop a simple resistor network model, which can reproduce the experimental data, and can be used to predict percolation trends in binary polymer nanoparticle glasses. Finally, we analyze the cluster statistics of simulated binary nanoparticle glasses, and characterize them according to their predominant local motifs as (p(i), p(1-i))-connected networks that can be used as a supramolecular toolbox for rational material design based on polymer nanoparticles.
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Affiliation(s)
- Lawrence A Renna
- Department of Chemistry, University of Massachusetts Amherst , Amherst, Massachusetts 01003-9303, United States
| | - Monojit Bag
- Department of Chemistry, University of Massachusetts Amherst , Amherst, Massachusetts 01003-9303, United States
| | - Timothy S Gehan
- Department of Chemistry, University of Massachusetts Amherst , Amherst, Massachusetts 01003-9303, United States
| | - Xu Han
- Department of Chemical Engineering, University of Massachusetts Amherst , Amherst, Massachusetts 01003-9303, United States
| | - Paul M Lahti
- Department of Chemistry, University of Massachusetts Amherst , Amherst, Massachusetts 01003-9303, United States
| | - Dimitrios Maroudas
- Department of Chemical Engineering, University of Massachusetts Amherst , Amherst, Massachusetts 01003-9303, United States
| | - D Venkataraman
- Department of Chemistry, University of Massachusetts Amherst , Amherst, Massachusetts 01003-9303, United States
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García-García A, Vovk A, Strichovanec P, Pardo JA, Magén C, Algarabel PA, De Teresa JM, Morellón L, Ibarra MR. Determination of the percolation threshold in Fe/MgO magnetic granular multilayers. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2010; 22:056003. [PMID: 21386355 DOI: 10.1088/0953-8984/22/5/056003] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
The evolution of the morphology, magnetic and transport properties of Fe(t nm)/MgO(3.0 nm) multilayers with respect to the nominal metallic layer thickness was investigated. A comparison with existing experimental data on discontinuous metal-insulator multilayers, ultrathin epitaxial Fe films on MgO substrates and granular cermet films is made. It is confirmed that the deposition conditions and the material composition play a crucial role in the percolation process. Nominal thicknesses of Fe layers at which an infinite metallic cluster is formed and the conditions for continuous Fe coverage were determined. Different methods of percolation threshold detection were analysed. We show that investigation of the temperature dependence of resistance in nanostructures could lead to an overestimation of the percolation threshold value, while magnetic measurements alone could lead to its underestimation.
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Affiliation(s)
- A García-García
- Instituto de Ciencia de Materiales de Aragón, Universidad de Zaragoza-CSIC, 50009-Zaragoza, Spain. Departamento de Física de la Materia Condensada, Universidad de Zaragoza, 50009-Zaragoza, Spain
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Arlen MJ, Wang D, Jacobs JD, Justice R, Trionfi A, Hsu JWP, Schaffer D, Tan LS, Vaia RA. Thermal−Electrical Character of in Situ Synthesized Polyimide-Grafted Carbon Nanofiber Composites. Macromolecules 2008. [DOI: 10.1021/ma801525f] [Citation(s) in RCA: 53] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
- Michael J. Arlen
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - David Wang
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - J. David Jacobs
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - Ryan Justice
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - Aaron Trionfi
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - Julia W. P. Hsu
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - Dale Schaffer
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - Loon-Seng Tan
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
| | - Richard A. Vaia
- Materials & Manufacturing Directorate, RXBN, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433-7750, Department of Polymers Science and Engineering, University of Akron, Akron, Ohio 44325-3909, University of Dayton Research Institute, Dayton, Ohio 45469-0168, School of Engineering, University of Cincinnati, Cincinnati, Ohio 45221, and Center for Integrated Nanotechnologies, Sandia National Laboratory, Albuquerque, New Mexico 87185
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