Surface states and the exponential valence-band tail in a-Si:H

Revisiting the Determination of the Valence Band Maximum and Defect Formation in Halide Perovskites for Solar Cells: Insights from Highly Sensitive Near-UV Photoemission Spectroscopy

Using advanced near-UV photoemission spectroscopy (PES) in constant final state mode (CFSYS) with a very high dynamic range, we investigate the triple-cation lead halide perovskite Cs_0.05(MA_0.17FA_0.83)_0.95Pb(I_0.83Br_0.17)₃ and gain detailed insights into the density of occupied states (DOS) in the valence band and band gap. A valence band model is established which includes the parabolic valence band edge and an exponentially decaying band tail in a single equation. This allows us to precisely determine two valence band maxima (VBM) at different k-vectors in the angle-integrated spectra, where the highest one, resulting from the VBM at the R-point in the Brillouin zone, is found between -1.50 to -1.37 eV relative to the Fermi energy E_F. We investigate quantitatively the formation of defect states in the band gap up to E_F upon decomposition of the perovskites during sample transfer, storage, and measurements: during near-UV-based PES, the density of defect states saturates at a value that is around 4 orders of magnitude below the density of states at the valence band edge. However, even short air exposure, or 3 h of X-ray illumination, increased their density by almost a factor of six and ∼40, respectively. Upon prolonged storage in vacuum, the formation of a distinct defect peak is observed. Thus, near-UV CFSYS with modeling as shown here is demonstrated as a powerful tool to characterize the valence band and quantify defect states in lead halide perovskites.

Determination of Insulator-to-Semiconductor Transition in Sol-Gel Oxide Semiconductors Using Derivative Spectroscopy

We report a derivative spectroscopic method for determining insulator-to-semiconductor transition during sol-gel metal-oxide semiconductor formation. When an as-spun sol-gel precursor film is photochemically activated and changes to semiconducting state, the light absorption characteristics of the metal-oxide film is considerable changed particularly in the ultraviolet region. As a result, a peak is generated in the first-order derivatives of light absorption (A′) vs. wavelength (λ) plots, and by tracing the peak center shift and peak intensity, transition from insulating-to-semiconducting state of the film can be monitored. The peak generation and peak center shift are described based on photon-energy-dependent absorption coefficient of metal-oxide films. We discuss detailed analysis method for metal-oxide semiconductor films and its application in thin-film transistor fabrication. We believe this derivative spectroscopy based determination can be beneficial for a non-destructive and a rapid monitoring of the insulator-to-semiconductor transition in sol-gel oxide semiconductor formation.

Band alignment at amorphous/crystalline silicon hetero-interfaces

We present an investigation of the band offsets in amorphous/crystalline silicon heterojunctions (a-Si:H/c-Si) using low energy photoelectron spectroscopy, ellipsometry and surface photovoltage data. For a variation of deposition conditions that lead to changes in hydrogen content and the thereby the a-Si:H band gap by ∼180 meV, we find that mainly the conduction band offset ΔEV varies, while ΔEC stays constant within experimental error. This result can be understood in the framework of charge neutrality (CNL) band lineup theory.

Electrical and Electronic Properties of Grain Boundaries in Silicon

The electronic states at silicon grain boundaries trap preferentially majority carriers, thus cause a potential barrier impeding current flow. We here summarize measurement techniques for the energy distribution of these grain boundary traps. The analysis reveals band tails due to disorder in the boundary plane as well as interface state continua at midgap. The spatial distribution of trapped charges results in significant electrostatic potential fluctuations which are observable in ac-admittance and noise experiments; the charge fluctuations cause in particular 1/f-like noise. The naive model of dangling bonds to describe grain boundary charges is insufficient, impurity atoms, especially oxygen, play essential roles in determining electronic behavior.