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Wang WB, Li W, Ohta R, Kambara M. Cluster-Assisted Mesoplasma Chemical Vapor Deposition for Fast Epitaxial Growth of SiGe/Si Heterostructures: A Molecular Dynamics Simulation Study. MATERIALS (BASEL, SWITZERLAND) 2024; 17:2448. [PMID: 38793514 PMCID: PMC11123204 DOI: 10.3390/ma17102448] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/16/2024] [Revised: 05/15/2024] [Accepted: 05/16/2024] [Indexed: 05/26/2024]
Abstract
Co-condensation of mixed SiGe nanoclusters and impingement of SiGe nanoclusters on a Si substrate were applied using molecular dynamics (MD) simulation in this study to mimic the fast epitaxial growth of SiGe/Si heterostructures under mesoplasma chemical vapor deposition (CVD) conditions. The condensation dynamics and properties of the SiGe nanoclusters during the simulations were investigated first, and then the impingement of transient SiGe nanoclusters on both Si smooth and trench substrate surfaces under varying conditions was studied theoretically. The results show that the mixed nanoclusters as precursors demonstrate potential for enhancing epitaxial SiGe film growth at a high growth rate, owing to their loosely bound atomic structures and high mobility on the substrate surface. By varying cluster sizes and substrate temperatures, this study also reveals that smaller clusters and higher substrate temperatures contribute to faster structural ordering and smoother surface morphologies. Furthermore, the formed layers display a consistent SiGe composition, closely aligning with nominal values, and the cluster-assisted deposition method achieves the epitaxial bridging of heterostructures during cluster impingement, highlighting its additional distinctive characteristics. The implications of this work make it clear that the mechanism of fast alloyed epitaxial film growth by cluster-assisted mesoplasma CVD is critical for extending it as a versatile platform for synthesizing various epitaxial films.
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Affiliation(s)
- Wen-bo Wang
- School of Materials Science and Engineering, Dongguan University of Technology, Dongguan 523808, China;
- School of Materials Science and Engineering, South China University of Technology, Guangzhou 510640, China
| | - Wenfang Li
- School of Materials Science and Engineering, Dongguan University of Technology, Dongguan 523808, China;
| | - Ryoshi Ohta
- Department of Materials Engineering, The University of Tokyo, 7-3-1, Hongo, Bunkyo, Tokyo 113-8656, Japan
| | - Makoto Kambara
- Department of Materials Engineering, The University of Tokyo, 7-3-1, Hongo, Bunkyo, Tokyo 113-8656, Japan
- Department of Materials and Manufacturing Science, Osaka University, 2-1, Yamadaoka, Suita 565-0871, Japan
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Le HLT, Jardali F, Vach H. Deposition of hydrogenated silicon clusters for efficient epitaxial growth. Phys Chem Chem Phys 2018; 20:15626-15634. [PMID: 29671430 DOI: 10.1039/c8cp00764k] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/13/2022]
Abstract
Epitaxial silicon thin films grown from the deposition of plasma-born hydrogenated silicon nanoparticles using plasma-enhanced chemical vapor deposition have widely been investigated due to their potential applications in photovoltaic and nanoelectronic device technologies. However, the optimal experimental conditions and the underlying growth mechanisms leading to the high-speed epitaxial growth of thin silicon films from hydrogenated silicon nanoparticles remain far from being understood. In the present work, extensive molecular dynamics simulations were performed to study the epitaxial growth of silicon thin films resulting from the deposition of plasma-born hydrogenated silicon clusters at low substrate temperatures under realistic reactor conditions. There is strong evidence that a temporary phase transition of the substrate area around the cluster impact site to the liquid state is necessary for the epitaxial growth to take place. We predict further that a non-normal incidence angle for the cluster impact significantly facilitates the epitaxial growth of thin crystalline silicon films.
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Affiliation(s)
- Ha-Linh Thi Le
- CNRS, LPICM, Ecole Polytechnique, University Paris-Saclay, 91128 Palaiseau, France.
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Valuev AA, Kaklyugin AS, Norman HE. Molecular modelling of the chemical interaction of atoms and molecules with a surface. RUSSIAN CHEMICAL REVIEWS 2007. [DOI: 10.1070/rc1995v064n07abeh000166] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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Rongwu L, Zhengying P, Yukun H. Molecular-dynamics simulations of slow copper cluster deposition. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 53:4156-4161. [PMID: 9983974 DOI: 10.1103/physrevb.53.4156] [Citation(s) in RCA: 29] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Haberland H, Insepov Z, Moseler M. Molecular-dynamics simulation of thin-film growth by energetic cluster impact. PHYSICAL REVIEW. B, CONDENSED MATTER 1995; 51:11061-11067. [PMID: 9977812 DOI: 10.1103/physrevb.51.11061] [Citation(s) in RCA: 139] [Impact Index Per Article: 4.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Gilmer GH. Structural transformations and defect production in ion implanted silicon: a molecular dynamics simulation study. PHYSICAL REVIEW LETTERS 1995; 74:2507-2510. [PMID: 10057945 DOI: 10.1103/physrevlett.74.2507] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Lee IH, Chang KJ. Atomic and electronic structure of amorphous Si from first-principles molecular-dynamics simulations. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 50:18083-18089. [PMID: 9976239 DOI: 10.1103/physrevb.50.18083] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Wang CZ, Ho KM. Structural trends in amorphous carbon. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 50:12429-12436. [PMID: 9975403 DOI: 10.1103/physrevb.50.12429] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Biswas R, Roos K, Tringides MC. Low-temperature growth on Si(111) substrates. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 50:10932-10940. [PMID: 9975197 DOI: 10.1103/physrevb.50.10932] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Kresse G, Hafner J. Ab initio molecular-dynamics simulation of the liquid-metal-amorphous-semiconductor transition in germanium. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 49:14251-14269. [PMID: 10010505 DOI: 10.1103/physrevb.49.14251] [Citation(s) in RCA: 7455] [Impact Index Per Article: 240.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Kwon I, Biswas R, Wang CZ, Ho KM, Soukoulis CM. Transferable tight-binding models for silicon. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 49:7242-7250. [PMID: 10009461 DOI: 10.1103/physrevb.49.7242] [Citation(s) in RCA: 44] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Wang CZ, Ho KM. Structure, dynamics, and electronic properties of diamondlike amorphous carbon. PHYSICAL REVIEW LETTERS 1993; 71:1184-1187. [PMID: 10055471 DOI: 10.1103/physrevlett.71.1184] [Citation(s) in RCA: 45] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Plasma deposition of hydrogenated amorphous silicon: Studies of the growth surface. ACTA ACUST UNITED AC 1993. [DOI: 10.1007/bf00331400] [Citation(s) in RCA: 76] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
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Fedders PA, Drabold DA. Hydrogen and defects in first-principles molecular-dynamics-modeled a-Si:H. PHYSICAL REVIEW. B, CONDENSED MATTER 1993; 47:13277-13282. [PMID: 10005632 DOI: 10.1103/physrevb.47.13277] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Aubin E, Lewis LJ. Growth of metallic superlattices by sequential deposition of atoms. PHYSICAL REVIEW. B, CONDENSED MATTER 1993; 47:6780-6783. [PMID: 10004659 DOI: 10.1103/physrevb.47.6780] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Molecular dynamics simulation of thin film formation by energetic cluster impact (ECI). ACTA ACUST UNITED AC 1993. [DOI: 10.1007/bf01429153] [Citation(s) in RCA: 33] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
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Balamane H, Halicioglu T, Tiller WA. Comparative study of silicon empirical interatomic potentials. PHYSICAL REVIEW. B, CONDENSED MATTER 1992; 46:2250-2279. [PMID: 10003901 DOI: 10.1103/physrevb.46.2250] [Citation(s) in RCA: 415] [Impact Index Per Article: 12.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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Bowler AM, Hood ES. Time‐dependent Monte Carlo studies of diffusion with surface steps. J Chem Phys 1992. [DOI: 10.1063/1.463966] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
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Fedders PA, Drabold DA, Klemm S. Defects, tight binding, and first-principles molecular-dynamics simulations on a-Si. PHYSICAL REVIEW. B, CONDENSED MATTER 1992; 45:4048-4055. [PMID: 10002017 DOI: 10.1103/physrevb.45.4048] [Citation(s) in RCA: 31] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Kwon I, Biswas R, Soukoulis CM. Molecular-dynamics simulations of defect formation in hydrogenated amorphous silicon. PHYSICAL REVIEW. B, CONDENSED MATTER 1992; 45:3332-3339. [PMID: 10001904 DOI: 10.1103/physrevb.45.3332] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Stich I, Car R, Parrinello M. Amorphous silicon studied by ab initio molecular dynamics: Preparation, structure, and properties. PHYSICAL REVIEW. B, CONDENSED MATTER 1991; 44:11092-11104. [PMID: 9999229 DOI: 10.1103/physrevb.44.11092] [Citation(s) in RCA: 96] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Feldman JL, Broughton JQ, Wooten F. Elastic properties of amorphous Si and derived Debye temperatures and Grüneisen parameters: Model calculation. PHYSICAL REVIEW. B, CONDENSED MATTER 1991; 43:2152-2158. [PMID: 9997485 DOI: 10.1103/physrevb.43.2152] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Brenner DW. Empirical potential for hydrocarbons for use in simulating the chemical vapor deposition of diamond films. PHYSICAL REVIEW. B, CONDENSED MATTER 1990; 42:9458-9471. [PMID: 9995183 DOI: 10.1103/physrevb.42.9458] [Citation(s) in RCA: 917] [Impact Index Per Article: 26.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Drabold DA, Fedders PA, Sankey OF, Dow JD. Molecular-dynamics simulations of amorphous Si. PHYSICAL REVIEW. B, CONDENSED MATTER 1990; 42:5135-5141. [PMID: 9996075 DOI: 10.1103/physrevb.42.5135] [Citation(s) in RCA: 43] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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