Egerton RF. TEM-EELS: a personal perspective.
Ultramicroscopy 2012;
119:24-32. [PMID:
22221958 DOI:
10.1016/j.ultramic.2011.11.008]
[Citation(s) in RCA: 9] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/02/2011] [Revised: 10/25/2011] [Accepted: 11/14/2011] [Indexed: 12/01/2022]
Abstract
The development of electron energy-loss spectroscopy in a transmission electron microscope (TEM-EELS) is illustrated through personal anecdote, highlighting some of the basic principles, instrumentation and personalities involved. The current state of the art is reviewed, together with some challenges for the future.
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