Klein C, Nabbefeld T, Hattab H, Meyer D, Jnawali G, Kammler M, Meyer zu Heringdorf FJ, Golla-Franz A, Müller BH, Schmidt T, Henzler M, Horn-von Hoegen M. Lost in reciprocal space? Determination of the scattering condition in spot profile analysis low-energy electron diffraction.
THE REVIEW OF SCIENTIFIC INSTRUMENTS 2011;
82:035111. [PMID:
21456793 DOI:
10.1063/1.3554305]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
The precise knowledge of the diffraction condition, i.e., the angle of incidence and electron energy, is crucial for the study of surface morphology through spot profile analysis low-energy electron diffraction (LEED). We demonstrate four different procedures to determine the diffraction condition: employing the distortion of the LEED pattern under large angles of incidence, the layer-by-layer growth oscillations during homoepitaxial growth, a G(S) analysis of a rough surface, and the intersection of facet rods with 3D Bragg conditions.
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