Okuma S, Togo S, Morita M. Enhancement of the quantum-liquid phase by increased resistivity in thick a-MoxSi1-x films.
PHYSICAL REVIEW LETTERS 2003;
91:067001. [PMID:
12935101 DOI:
10.1103/physrevlett.91.067001]
[Citation(s) in RCA: 4] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/30/2002] [Indexed: 05/24/2023]
Abstract
Effects of normal-state resistivity rho(n) on the vortex phase diagram at low temperature T have been studied based on dc and ac complex resistivities for thick amorphous MoxSi(1-x) films. It is commonly observed irrespective of rho(n) that, in the limit T=0, the vortex-glass-transition line B(g)(T) is independent of T and extrapolates to a field below the T=0 upper critical field B(c2)(0), indicative of the quantum-vortex-liquid (QVL) phase in the regime B(g)(0)<B<B(c2)(0). The relative width of the QVL phase increases along the B and T axes approximately proportional to rho(n). This result is consistent with a view that the QVL phase is caused by strong quantum fluctuations, which are enhanced with increasing rho(n).
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