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Deng X, Namboodiri P, Li K, Wang X, Stan G, Myers AF, Cheng X, Li T, Silver RM. Silicon epitaxy on H-terminated Si (100) surfaces at 250 °C. APPLIED SURFACE SCIENCE 2016; 378:301-307. [PMID: 27397949 PMCID: PMC4929620 DOI: 10.1016/j.apsusc.2016.03.212] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
Low temperature Si epitaxy has become increasingly important due to its critical role in the encapsulation and performance of buried nanoscale dopant devices. We demonstrate epitaxial growth up to nominally 25 nm, at 250°C, with analysis at successive growth steps using STM and cross section TEM to reveal the nature and quality of the epitaxial growth. STM images indicate that growth morphology of both Si on Si and Si on H-terminated Si (H: Si) is epitaxial in nature at temperatures as low as 250 °C. For Si on Si growth at 250 °C, we show that the Si epitaxial growth front maintains a constant morphology after reaching a specific thickness threshold. Although the in-plane mobility of silicon is affected on the H: Si surface due to the presence of H atoms during initial sub-monolayer growth, STM images reveal long range order and demonstrate that growth proceeds by epitaxial island growth albeit with noticeable surface roughening.
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Affiliation(s)
- Xiao Deng
- School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Pradeep Namboodiri
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Kai Li
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Xiqiao Wang
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States; University of Maryland, College Park, Maryland 20740, United States
| | - Gheorghe Stan
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Alline F Myers
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Xinbin Cheng
- School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China
| | - Tongbao Li
- School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China
| | - Richard M Silver
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
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Park C, Gu G, Lee B, Jang D. Effects of growth pressure on the structural and optical properties of multi quantum wells (MQWs) in blue LED. Ultramicroscopy 2013; 127:114-8. [DOI: 10.1016/j.ultramic.2012.07.009] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/28/2022]
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Lin XZ, Li J, Wu QH. Influences of h on the adsorption of a single ag atom on si(111)-7 × 7 surface. NANOSCALE RESEARCH LETTERS 2009; 5:143-148. [PMID: 20652141 PMCID: PMC2894020 DOI: 10.1007/s11671-009-9456-x] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 07/20/2009] [Accepted: 09/26/2009] [Indexed: 05/29/2023]
Abstract
The adsorption of a single Ag atom on both clear Si(111)-7 × 7 and 19 hydrogen terminated Si(111)-7 × 7 (hereafter referred as 19H-Si(111)-7 × 7) surfaces has been investigated using first-principles calculations. The results indicated that the pre-adsorbed H on Si surface altered the surface electronic properties of Si and influenced the adsorption properties of Ag atom on the H terminated Si surface (e.g., adsorption site and bonding properties). Difference charge density data indicated that covalent bond is formed between adsorbed Ag and H atoms on 19H-Si(111)-7 × 7 surface, which increases the adsorption energy of Ag atom on Si surface.
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Affiliation(s)
- Xiu-Zhu Lin
- Department of Physics, Xiamen University, 361005, Xiamen, China
| | - Jing Li
- Department of Physics, Xiamen University, 361005, Xiamen, China
- Pen-Tung Sah MEMS Research Center, Xiamen University, 361005, Xiamen, China
| | - Qi-Hui Wu
- Department of Physics, Xiamen University, 361005, Xiamen, China
- Department of Physics, La Trobe University, Bundoora, VIC, 3086, Australia
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Yoder NL, Fakonas JS, Hersam MC. Control and Characterization of Cyclopentene Unimolecular Dissociation on Si(100) with Scanning Tunneling Microscopy. J Am Chem Soc 2009; 131:10059-65. [DOI: 10.1021/ja9010546] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/18/2022]
Affiliation(s)
- Nathan L. Yoder
- Department of Materials Science and Engineering, Department of Chemistry, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208-3108
| | - James S. Fakonas
- Department of Materials Science and Engineering, Department of Chemistry, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208-3108
| | - Mark C. Hersam
- Department of Materials Science and Engineering, Department of Chemistry, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208-3108
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Doren DJ. Kinetics and Dynamics of Hydrogen Adsorption and Desorption on Silicon Surfaces. ADVANCES IN CHEMICAL PHYSICS 2007. [DOI: 10.1002/9780470141540.ch1] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/20/2023]
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Kutana A, Makarenko B, Rabalais JW. Kinetics of H atom adsorption on Si(100) at 500–650 K. J Chem Phys 2003. [DOI: 10.1063/1.1624827] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/14/2023] Open
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Si adatom diffusion on Si (100) surface in selective epitaxial growth of Si. ACTA ACUST UNITED AC 2003. [DOI: 10.1116/1.1621656] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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Herrmann CF, Boland JJ. Vacancy dynamics and reorganization on bromine-etched Si(100)-(2 x 1) surfaces. PHYSICAL REVIEW LETTERS 2001; 87:115503. [PMID: 11531535 DOI: 10.1103/physrevlett.87.115503] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/12/2001] [Revised: 06/06/2001] [Indexed: 05/23/2023]
Abstract
Halogen etching of Si(100) surfaces has long been considered to involve the selective removal of atoms from an essentially static surface. Here we show that vacancy sites produced by etching are mobile at elevated temperature and rearrange to form features that were considered to be the direct products of etching. We demonstrate that the etch features observed at different temperatures are not due to different mechanisms. Rather, kinetic etch products formed at low temperatures are transformed into thermodynamically more stable features at higher temperatures.
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Affiliation(s)
- C F Herrmann
- Venable and Kenan Laboratories, Department of Chemistry, University of North Carolina, Chapel Hill, North Carolina 27599-3290, USA
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Zimmermann FM, Pan X. Interaction of H2 with Si(001)-(2 x 1): solution of the barrier puzzle. PHYSICAL REVIEW LETTERS 2000; 85:618-621. [PMID: 10991354 DOI: 10.1103/physrevlett.85.618] [Citation(s) in RCA: 26] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/07/2000] [Indexed: 05/23/2023]
Abstract
The sticking probability of H2 on Si(001) is immeasurably small at room temperature, indicating the presence of a large energy barrier to adsorption. Surprisingly, the final state energy distributions of H2 molecules desorbing from Si(001) show no signs of having traversed such a barrier, in apparent contradiction with microscopic reversibility. Here we report experimental and theoretical evidence resolving this long-standing puzzle. Adsorption and desorption proceeding along two distinct, microscopically reversible pathways can explain all observations.
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Affiliation(s)
- F M Zimmermann
- Department of Physics and Laboratory for Surface Modification, Rutgers University, Piscataway, New Jersey 08854, USA
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Davidson R, Kozak JJ. Stochastic Approach to the Study of Atomistic Processes in the Early Stages of Thin-Film Growth. 2. Island Formation. J Phys Chem B 1998. [DOI: 10.1021/jp972823p] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
- Russell Davidson
- GREQAM, 2 Rue de la Charite, 13002 Marseille, France and Department of Economics, Queen's University, Kingston, Ontario K7L 3N6, Canada
| | - John J. Kozak
- Department of Chemistry, Iowa State University, Ames, Iowa 50011
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Abstract
▪ Abstract Growth of thin films from atoms deposited from the gas phase is intrinsically a non-equilibrium phenomenon dictated by a competition between kinetics and thermodynamics. Precise control of the growth becomes possible only after achieving an understanding of this competition. In this review, we present an atomistic view of the various kinetic aspects in a model system, the epitaxy of Si on Si(001), as revealed by scanning tunneling microscopy and total-energy calculations. Fundamentally important issues investigated include adsorption dynamics and energetics, adatom diffusion, nucleation, sticking, and detachment. We also briefly discuss the inverse process of growth, removal by sputtering or etching. We aim our discussions to an understanding at a quantitative level whenever possible.
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Affiliation(s)
- Zhenyu Zhang
- Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6032
- University of Wisconsin, Madison, Wisconsin 53706
- *present address: Komag, Inc., 275 South Hillview Drive, Milpitas, California 95035
| | - Fang Wu
- Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6032
- University of Wisconsin, Madison, Wisconsin 53706
- *present address: Komag, Inc., 275 South Hillview Drive, Milpitas, California 95035
| | - Max G. Lagally
- Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6032
- University of Wisconsin, Madison, Wisconsin 53706
- *present address: Komag, Inc., 275 South Hillview Drive, Milpitas, California 95035
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Abstract
Growth of thin films from atoms deposited from the gas phase is intrinsically a nonequilibrium phenomenon governed by a competition between kinetics and thermodynamics. Precise control of the growth and thus of the properties of deposited films becomes possible only after an understanding of this competition is achieved. Here, the atomic nature of the most important kinetic mechanisms of film growth is explored. These mechanisms include adatom diffusion on terraces, along steps, and around island corners; nucleation and dynamics of the stable nucleus; atom attachment to and detachment from terraces and islands; and interlayer mass transport. Ways to manipulate the growth kinetics in order to select a desired growth mode are briefly addressed.
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Affiliation(s)
- Z Zhang
- Z. Y. Zhang is a research staff member in the Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6032, USA. E-mail: . M. G. Lagally is the E.W. Mueller Professor in the Departments of Materials Science and Engineering and Physics, University of Wisconsin, Madison, WI 53706, USA. E-mail:
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Copel M, Tromp RM. Comment on "Role of hydrogen in C and Si(001) homoepitaxy". PHYSICAL REVIEW LETTERS 1996; 76:2603. [PMID: 10060741 DOI: 10.1103/physrevlett.76.2603] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Ogitsu T, Miyazaki T, Fujita M, Okazaki M. Ogitsu et al. reply. PHYSICAL REVIEW LETTERS 1996; 76:2604. [PMID: 10060742 DOI: 10.1103/physrevlett.76.2604] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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