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For: Dannefaer S, Craigen D, Kerr D. Carbon and silicon vacancies in electron-irradiated 6H-SiC. Phys Rev B Condens Matter 1995;51:1928-1930. [PMID: 9978918 DOI: 10.1103/physrevb.51.1928] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
Number Cited by Other Article(s)
1
Liu Y, Wang G, Wang S, Yang J, Chen L, Qin X, Song B, Wang B, Chen X. Defect-induced magnetism in neutron irradiated 6H-SiC single crystals. PHYSICAL REVIEW LETTERS 2011;106:087205. [PMID: 21405599 DOI: 10.1103/physrevlett.106.087205] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/07/2010] [Indexed: 05/30/2023]
2
Wang HY, Weng HM, Zhou XY. Defect Characterization of 6H-SiC Studied by Slow Positron Beam. CHINESE J CHEM PHYS 2008. [DOI: 10.1088/1674-0068/21/04/333-338] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
3
Rempel AA, Sprengel W, Blaurock K, Reichle KJ, Major J, Schaefer HE. Identification of lattice vacancies on the two sublattices of SiC. PHYSICAL REVIEW LETTERS 2002;89:185501. [PMID: 12398613 DOI: 10.1103/physrevlett.89.185501] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/26/2001] [Indexed: 05/24/2023]
4
Itoh H, Kawasuso A, Ohshima T, Yoshikawa M, Nashiyama I, Tanigawa S, Misawa S, Okumura H, Yoshida S. Intrinsic Defects in Cubic Silicon Carbide. ACTA ACUST UNITED AC 1997. [DOI: 10.1002/1521-396x(199707)162:1<173::aid-pssa173>3.0.co;2-w] [Citation(s) in RCA: 127] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
5
Brauer G, Anwand W, Coleman PG, Knights AP, Plazaola F, Pacaud Y, Skorupa W, Störmer J, Willutzki P. Positron studies of defects in ion-implanted SiC. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;54:3084-3092. [PMID: 9986206 DOI: 10.1103/physrevb.54.3084] [Citation(s) in RCA: 36] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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