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For: Yater JE, Shih A, Idzerda YU. Structural characterization of stepped Ga/Si(112) surfaces. Phys Rev B Condens Matter 1995;51:7365-7368. [PMID: 9977314 DOI: 10.1103/physrevb.51.7365] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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