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For: Rücker H, Methfessel M. Anharmonic Keating model for group-IV semiconductors with application to the lattice dynamics in alloys of Si, Ge, and C. Phys Rev B Condens Matter 1995;52:11059-11072. [PMID: 9980204 DOI: 10.1103/physrevb.52.11059] [Citation(s) in RCA: 71] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
Number Cited by Other Article(s)
1
Yang X, Liu Y, Liu XJ, Peng JZ, Zhao H, Sun CQ. Composition- and Temperature-Resolved Raman Shift of Silicon. APPLIED SPECTROSCOPY 2018;72:598-603. [PMID: 29148286 DOI: 10.1177/0003702817744218] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
2
Turneaure SJ, Sharma SM, Volz TJ, Winey JM, Gupta YM. Transformation of shock-compressed graphite to hexagonal diamond in nanoseconds. SCIENCE ADVANCES 2017;3:eaao3561. [PMID: 29098183 PMCID: PMC5659656 DOI: 10.1126/sciadv.aao3561] [Citation(s) in RCA: 21] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/11/2017] [Accepted: 09/27/2017] [Indexed: 05/13/2023]
3
Mukherjee C, Das T, Mahata C, Maiti CK, Chia CK, Chiam SY, Chi DZ, Dalapati GK. Interface properties of atomic layer deposited TiO2/Al2O3 films on In(0.53)Ga(0.47)As/InP substrates. ACS APPLIED MATERIALS & INTERFACES 2014;6:3263-3274. [PMID: 24472090 DOI: 10.1021/am405019d] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
4
Ameri M, Bouzouira N, Khenata R, Al-Douri Y, Bouhafs B, Bin-Omran S. FP-LMTO method to calculate the structural, thermodynamic and optoelectronic properties of SixGe1−xC alloys. Mol Phys 2013. [DOI: 10.1080/00268976.2013.775517] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
5
Raman Imaging in Semiconductor Physics: Applications to Microelectronic Materials and Devices. RAMAN IMAGING 2012. [DOI: 10.1007/978-3-642-28252-2_2] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/22/2023]
6
Verma AS, Bhardwaj SR. Correlation between ionic charge and ground-state properties in rocksalt and zinc blende structured solids. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2006;18:8603-8612. [PMID: 21690912 DOI: 10.1088/0953-8984/18/37/018] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
7
Sim E, Beckers J, de Leeuw S, Thorpe M, Ratner MA. Parametrization of an anharmonic Kirkwood-Keating potential for AlxGa1-xAs alloys. J Chem Phys 2005;122:174702. [PMID: 15910055 DOI: 10.1063/1.1883628] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
8
Kessler DA, Levine H. Arrested cracks in nonlinear lattice models of brittle fracture. PHYSICAL REVIEW. E, STATISTICAL PHYSICS, PLASMAS, FLUIDS, AND RELATED INTERDISCIPLINARY TOPICS 1999;60:7569-71. [PMID: 11970711 DOI: 10.1103/physreve.60.7569] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/22/1999] [Indexed: 04/18/2023]
9
Meléndez-Lira M, Menéndez J, Windl W, Sankey OF, Spencer GS, Sego S, Culbertson RB, Bair AE, Alford TL. Carbon dependence of Raman mode frequencies in Si1-x-yGexCy alloys. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;54:12866-12872. [PMID: 9985144 DOI: 10.1103/physrevb.54.12866] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
10
Rücker H, Methfessel M, Dietrich B, Pressel K, Osten HJ. Phonons as a probe of short-range order in Si1-xCx alloys. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;53:1302-1309. [PMID: 9983588 DOI: 10.1103/physrevb.53.1302] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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