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For: Tucek JC, Walton SG, Champion RL. Secondary-electron and negative-ion emission from Al: Effect of oxygen coverage. Phys Rev B Condens Matter 1996;53:14127-14134. [PMID: 9983207 DOI: 10.1103/physrevb.53.14127] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

For:	Tucek JC, Walton SG, Champion RL. Secondary-electron and negative-ion emission from Al: Effect of oxygen coverage. Phys Rev B Condens Matter 1996;53:14127-14134. [PMID: 9983207 DOI: 10.1103/physrevb.53.14127] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

Number	Cited by Other Article(s)
1	Maas DJ, van Gastel R. Helium Ion Microscopy. SURFACE SCIENCE TECHNIQUES 2013. [DOI: 10.1007/978-3-642-34243-1_16] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/05/2023] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
2	Poelman H, Tomaszewski H, Poelman D, Fiermans L, De Gryse R, Reyniers MF, Marin GB. V2O5 thin films deposited by means of d.c. magnetron sputtering from ceramic V2O3 targets. SURF INTERFACE ANAL 2002. [DOI: 10.1002/sia.1397] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse