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For: Mestres N, Alsina F, Pascual J, Bluet JM, Camassel J, Geng C, Scholz F. Edge-on micro-Raman assessment of trigonal modes in partially ordered GaInP2. Phys Rev B Condens Matter 1996;54:17754-17758. [PMID: 9985905 DOI: 10.1103/physrevb.54.17754] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

For:	Mestres N, Alsina F, Pascual J, Bluet JM, Camassel J, Geng C, Scholz F. Edge-on micro-Raman assessment of trigonal modes in partially ordered GaInP2. Phys Rev B Condens Matter 1996;54:17754-17758. [PMID: 9985905 DOI: 10.1103/physrevb.54.17754] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

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1	Korbutowicz R, Tłaczała M, Kovač J, Irmer G, Srnanek R. Cross-sectional and surface Raman mapping of thick GaN layers. CRYSTAL RESEARCH AND TECHNOLOGY 2008. [DOI: 10.1002/crat.200800245] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse

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Korbutowicz R, Tłaczała M, Kovač J, Irmer G, Srnanek R. Cross-sectional and surface Raman mapping of thick GaN layers. CRYSTAL RESEARCH AND TECHNOLOGY 2008. [DOI: 10.1002/crat.200800245] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]