Kubota Y, Lattery M, Nelson JK, Patton S, Poling R, Riehle T, Savinov V, Wang R, Alam MS, Kim IJ, Ling Z, Mahmood AH, O'Neill JJ, Severini H, Sun CR, Timm S, Wappler F, Crawford G, Duboscq JE, Fulton R, Fujino D, Gan KK, Honscheid K, Kagan H, Kass R, Lee J, Sung M, White C, Wanke R, Wolf A, Zoeller MM, Fu X, Nemati B, Ross WR, Skubic P, Wood M, Bishai M, Fast J, Gerndt E, Hinson JW, Miao T, Miller DH, Modesitt M, Shibata EI, Shipsey IP, Wang PN, Gibbons L, Johnson SD, Kwon Y, Roberts S, Thorndike EH, Coan TE, Dominick J, Fadeyev V, Korolkov I, Lambrecht M, Sanghera S, Shelkov V, Stroynowski R, Volobouev I, Wei G, Artuso M, Gao M, Goldberg M. Measurement of the inclusive semielectronic D0 branching fraction.
PHYSICAL REVIEW. D, PARTICLES AND FIELDS 1996;
54:2994-3005. [PMID:
10020978 DOI:
10.1103/physrevd.54.2994]
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