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For: Krüger H, Thiessen E, Bronold FX, Fehske H, Melzer A. Charge measurement of SiO_{2} nanoparticles in an rf plasma by ir absorption. Phys Rev E 2021;104:045208. [PMID: 34781538 DOI: 10.1103/physreve.104.045208] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/30/2021] [Accepted: 09/24/2021] [Indexed: 11/07/2022]

For:	Krüger H, Thiessen E, Bronold FX, Fehske H, Melzer A. Charge measurement of SiO_{2} nanoparticles in an rf plasma by ir absorption. Phys Rev E 2021;104:045208. [PMID: 34781538 DOI: 10.1103/physreve.104.045208] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/30/2021] [Accepted: 09/24/2021] [Indexed: 11/07/2022]

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(The first 100,000 artilces are displayed in RCA.)