Aarão Reis FDA. Dynamic transition in etching with poisoning.
PHYSICAL REVIEW. E, STATISTICAL, NONLINEAR, AND SOFT MATTER PHYSICS 2003;
68:041602. [PMID:
14682948 DOI:
10.1103/physreve.68.041602]
[Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/19/2003] [Indexed: 05/24/2023]
Abstract
We study a lattice model for etching of a crystalline solid including the deposition of a poisoning species. The model considers normal and lateral erosion of the columns of the solid by a flux of etching particles and the blocking effects of impurities formed at the surface. As the probability p of formation of this poisoning species increases, the etching rate decreases and a continuous transition to a pinned phase is observed. The transition is in the directed percolation (DP) class, with the fraction of the exposed columns as the order parameter. This interpretation is consistent with a mapping of the interface problem in d+1 dimensions onto a d-dimensional contact process, and is confirmed by numerical results in d=1 and d=2. In the etching phase, the interface width scales with Kardar-Parisi-Zhang (KPZ) exponents, and shows a crossover from the critical DP behavior (W approximately t) to KPZ near the critical point, at etching times of the order of (pc-p)(-nu(||)). Anomalous roughening is observed at criticality, with the roughness exponent related to DP exponents as alphac=nu(||)/nu(perpendicular)>1. The main differences from previously studied DP transitions in growth models and isotropic percolation transitions in etching models are discussed. Investigations in real systems are suggested.
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