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For: Qi Y, Sheldon BW, Guo H, Xiao X, Kothari AK. Impact of surface chemistry on grain boundary induced intrinsic stress evolution during polycrystalline thin film growth. Phys Rev Lett 2009;102:056101. [PMID: 19257525 DOI: 10.1103/physrevlett.102.056101] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/31/2008] [Indexed: 05/27/2023]
Number Cited by Other Article(s)
1
Mukhopadhyay A, Tokranov A, Xiao X, Sheldon BW. Stress development due to surface processes in graphite electrodes for Li-ion batteries: A first report. Electrochim Acta 2012. [DOI: 10.1016/j.electacta.2012.01.058] [Citation(s) in RCA: 89] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
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