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Barborini M, Sorella S, Rontani M, Corni S. Angle-resolved photoemission spectroscopy from first-principles quantum Monte Carlo. J Chem Phys 2018; 149:154102. [DOI: 10.1063/1.5038864] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022] Open
Affiliation(s)
| | - Sandro Sorella
- Scuola Internazionale Superiore di Studi Avanzati (SISSA) and CNR-IOM Democritos National Simulation Center, Via Bonomea 265, 34136 Trieste, Italy
| | | | - Stefano Corni
- CNR-NANO, Via Campi 213/a, 41125 Modena, Italy
- Dipartimento di Scienze Chimiche—Università degli Studi di Padova, Via Marzolo 1, 35131 Padova, Italy
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Barillot T, Brédy R, Celep G, Cohen S, Compagnon I, Concina B, Constant E, Danakas S, Kalaitzis P, Karras G, Lépine F, Loriot V, Marciniak A, Predelus-Renois G, Schindler B, Bordas C. Influence of long-range Coulomb interaction in velocity map imaging. J Chem Phys 2017; 147:013929. [PMID: 28688435 DOI: 10.1063/1.4982616] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
Abstract
The standard velocity-map imaging (VMI) analysis relies on the simple approximation that the residual Coulomb field experienced by the photoelectron ejected from a neutral or ion system may be neglected. Under this almost universal approximation, the photoelectrons follow ballistic (parabolic) trajectories in the externally applied electric field, and the recorded image may be considered as a 2D projection of the initial photoelectron velocity distribution. There are, however, several circumstances where this approximation is not justified and the influence of long-range forces must absolutely be taken into account for the interpretation and analysis of the recorded images. The aim of this paper is to illustrate this influence by discussing two different situations involving isolated atoms or molecules where the analysis of experimental images cannot be performed without considering long-range Coulomb interactions. The first situation occurs when slow (meV) photoelectrons are photoionized from a neutral system and strongly interact with the attractive Coulomb potential of the residual ion. The result of this interaction is the formation of a more complex structure in the image, as well as the appearance of an intense glory at the center of the image. The second situation, observed also at low energy, occurs in the photodetachment from a multiply charged anion and it is characterized by the presence of a long-range repulsive potential. Then, while the standard VMI approximation is still valid, the very specific features exhibited by the recorded images can be explained only by taking into consideration tunnel detachment through the repulsive Coulomb barrier.
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Affiliation(s)
- T Barillot
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - R Brédy
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - G Celep
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - S Cohen
- Atomic and Molecular Physics Laboratory, Physics Department, University of Ioannina, 45110 Ioannina, Greece
| | - I Compagnon
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - B Concina
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - E Constant
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - S Danakas
- Atomic and Molecular Physics Laboratory, Physics Department, University of Ioannina, 45110 Ioannina, Greece
| | - P Kalaitzis
- Atomic and Molecular Physics Laboratory, Physics Department, University of Ioannina, 45110 Ioannina, Greece
| | - G Karras
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - F Lépine
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - V Loriot
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - A Marciniak
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - G Predelus-Renois
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - B Schindler
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
| | - C Bordas
- Institut Lumière Matière, Université de Lyon, CNRS, UMR5306, 69622 Villeurbanne, France
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Zhou P, Gan Z, Huang X, Mei C, Huang M, Xia Y, Wang H. Nonvolatile and tunable switching of lateral photo-voltage triggered by laser and electric pulse in metal dusted metal-oxide-semiconductor structures. Sci Rep 2016; 6:32015. [PMID: 27535351 PMCID: PMC4989190 DOI: 10.1038/srep32015] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/05/2016] [Accepted: 08/01/2016] [Indexed: 11/09/2022] Open
Abstract
Owing to the innate stabilization of built-in potential in p-n junction or metal-oxide-semiconductor structure, the sensitivity and linearity of most lateral photovoltaic effect (LPE) devices is always fixed after fabrication. Here we report a nonvolatile and tunable switching effect of lateral photo-voltage (LPV) in Cu dusted ultrathin metal-oxide-semiconductor structure. With the stimulation of electric pulse and local illumination, the sensitivity and linearity of LPV can be adjusted up and down in a nonvolatile manner. This phenomenon is attributed to a controllable change of the Schottky barrier formed between the metal layer and silicon substrate, including the consequent change of film resistivity. This work may widely improve the performance of existing LPE-based devices and suggest new applications for LPE in other areas.
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Affiliation(s)
- Peiqi Zhou
- The State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Physics and Astronomy, the Key Laboratory of Thin Film and Nano-microfabrication Technology of the Ministry of Education, and Department of Instrument Science and Engineering, Shanghai JiaoTong University, 800 Dongchuan Rd, Shanghai 200240, P. R. China
| | - Zhikai Gan
- The State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Physics and Astronomy, the Key Laboratory of Thin Film and Nano-microfabrication Technology of the Ministry of Education, and Department of Instrument Science and Engineering, Shanghai JiaoTong University, 800 Dongchuan Rd, Shanghai 200240, P. R. China
| | - Xu Huang
- The State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Physics and Astronomy, the Key Laboratory of Thin Film and Nano-microfabrication Technology of the Ministry of Education, and Department of Instrument Science and Engineering, Shanghai JiaoTong University, 800 Dongchuan Rd, Shanghai 200240, P. R. China
| | - Chunlian Mei
- The State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Physics and Astronomy, the Key Laboratory of Thin Film and Nano-microfabrication Technology of the Ministry of Education, and Department of Instrument Science and Engineering, Shanghai JiaoTong University, 800 Dongchuan Rd, Shanghai 200240, P. R. China
| | - Meizhen Huang
- The State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Physics and Astronomy, the Key Laboratory of Thin Film and Nano-microfabrication Technology of the Ministry of Education, and Department of Instrument Science and Engineering, Shanghai JiaoTong University, 800 Dongchuan Rd, Shanghai 200240, P. R. China
| | - Yuxing Xia
- The State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Physics and Astronomy, the Key Laboratory of Thin Film and Nano-microfabrication Technology of the Ministry of Education, and Department of Instrument Science and Engineering, Shanghai JiaoTong University, 800 Dongchuan Rd, Shanghai 200240, P. R. China
| | - Hui Wang
- The State Key Laboratory of Advanced Optical Communication Systems and Networks, Department of Physics and Astronomy, the Key Laboratory of Thin Film and Nano-microfabrication Technology of the Ministry of Education, and Department of Instrument Science and Engineering, Shanghai JiaoTong University, 800 Dongchuan Rd, Shanghai 200240, P. R. China
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Stodolna AS, Lépine F, Bergeman T, Robicheaux F, Gijsbertsen A, Jungmann JH, Bordas C, Vrakking MJJ. Visualizing the coupling between red and blue stark states using photoionization microscopy. PHYSICAL REVIEW LETTERS 2014; 113:103002. [PMID: 25238354 DOI: 10.1103/physrevlett.113.103002] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/24/2013] [Indexed: 06/03/2023]
Abstract
In nonhydrogenic atoms in a dc electric field, the finite size of the ionic core introduces a coupling between quasibound Stark states that leads to avoided crossings between states that would otherwise cross. Near an avoided crossing, the interacting states may have decay amplitudes that cancel each other, decoupling one of the states from the ionization continuum. This well-known interference narrowing effect, observed as a strongly electric field-dependent decrease in the ionization rate, was previously observed in several atoms. Here we use photoionization microscopy to visualize interference narrowing in helium atoms, thereby explicitly revealing the mechanism by which Stark states decay. The interference narrowing allows measurements of the nodal patterns of red Stark states, which are otherwise not observable due to their intrinsic short lifetime.
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Affiliation(s)
- A S Stodolna
- FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands
| | - F Lépine
- Institut Lumiére Matiére, Université Lyon 1, CNRS, UMR 5306, 10 rue Ada Byron, 69622 Villeurbanne Cedex, France
| | - T Bergeman
- Physics and Astronomy, Stony Brook University, Stony Brook, New York 11794, USA
| | - F Robicheaux
- Department of Physics, Purdue University, West Lafayette, Indiana 47907, USA
| | - A Gijsbertsen
- FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands
| | - J H Jungmann
- FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands
| | - C Bordas
- Institut Lumiére Matiére, Université Lyon 1, CNRS, UMR 5306, 10 rue Ada Byron, 69622 Villeurbanne Cedex, France
| | - M J J Vrakking
- FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands and Max-Born-Institut, Max Born Straße 2A, D-12489 Berlin, Germany
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