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Fowler J, Miaja-Avila L, O’Neil G, Ullom J, Whitelock H, Swetz D. The potential of microcalorimeter X-ray spectrometers for measurement of relative fluorescence-line intensities. Radiat Phys Chem Oxf Engl 1993 2023. [DOI: 10.1016/j.radphyschem.2022.110487] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
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Beckhoff B. Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation. NANOMATERIALS 2022; 12:nano12132255. [PMID: 35808090 PMCID: PMC9268651 DOI: 10.3390/nano12132255] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/27/2022] [Revised: 05/27/2022] [Accepted: 06/12/2022] [Indexed: 11/16/2022]
Abstract
Traceable characterization methods allow for the accurate correlation of the functionality or toxicity of nanomaterials with their underlaying chemical, structural or physical material properties. These correlations are required for the directed development of nanomaterials to reach target functionalities such as conversion efficiencies or selective sensitivities. The reliable characterization of nanomaterials requires techniques that often need to be adapted to the nano-scaled dimensions of the samples with respect to both the spatial dimensions of the probe and the instrumental or experimental discrimination capability. The traceability of analytical methods revealing information on chemical material properties relies on reference materials or qualified calibration samples, the spatial elemental distributions of which must be very similar to the nanomaterial of interest. At the nanoscale, however, only few well-known reference materials exist. An alternate route to establish the required traceability lays in the physical calibration of the analytical instrument’s response behavior and efficiency in conjunction with a good knowledge of the various interaction probabilities. For the elemental analysis, speciation, and coordination of nanomaterials, such a physical traceability can be achieved with X-ray spectrometry. This requires the radiometric calibration of energy- and wavelength-dispersive X-ray spectrometers, as well as the reliable determination of atomic X-ray fundamental parameters using such instrumentation. In different operational configurations, the information depths, discrimination capability, and sensitivity of X-ray spectrometry can be considerably modified while preserving its traceability, allowing for the characterization of surface contamination as well as interfacial thin layer and nanoparticle chemical compositions. Furthermore, time-resolved and hybrid approaches provide access to analytical information under operando conditions or reveal dimensional information, such as elemental or species depth profiles of nanomaterials. The aim of this review is to demonstrate the absolute quantification capabilities of SI-traceable X-ray spectrometry based upon calibrated instrumentation and knowledge about X-ray interaction probabilities.
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Affiliation(s)
- Burkhard Beckhoff
- Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587 Berlin, Germany
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Pollakowski-Herrmann B, Hornemann A, Giovannozzi AM, Green F, Gunning P, Portesi C, Rossi A, Seim C, Steven R, Tyler B, Beckhoff B. A calibration procedure for a traceable contamination analysis on medical devices by combined X-ray spectrometry and ambient spectroscopic techniques. J Pharm Biomed Anal 2018; 150:308-317. [PMID: 29272815 DOI: 10.1016/j.jpba.2017.12.007] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/28/2017] [Revised: 11/09/2017] [Accepted: 12/05/2017] [Indexed: 11/26/2022]
Abstract
There is a strong need in the medical device industry to decrease failure rates of biomedical devices by reducing the incidence of defect structures and contaminants during the production process. The detection and identification of defect structures and contaminants is crucial for many industrial applications. The present study exploits reference-free X-ray fluorescence (XRF) analysis as an analytical tool for the traceable characterization of surface contaminants of medical devices, in particular N,N'-ethylene-bis (stearamide), an ubiquitous compound used in many industrial applications as a release agent or friction reduction additive. Reference-free XRF analysis as primary method has been proven to be capable of underpinning all other applied methods since it yields the absolute mass deposition of the selected N,N'-ethylene-bis (stearamide) contaminant whilst X-ray absorption fine structure analysis determines the chemical species. Ambient vibrational spectroscopy and mass spectroscopy methodologies such as Fourier transform infrared, Raman, and secondary ion mass spectroscopy have been used in this systematic procedure providing an extensive range of complementary analyses. The calibration procedure described in this paper was developed using specially designed and fabricated model systems varying in thickness and substrate material. Furthermore, typical real medical devices such as both a polyethylene hip liner and a silver-coated wound dressing have been contaminated and investigated by these diverse methods, enabling testing of this developed procedure. These well-characterized samples may be used as calibration standards for bench top instrumentation from the perspective of providing traceable analysis of biomaterials and surface treatments. These findings demonstrate the potential importance and usefulness of combining complementary methods for a better understanding of the relevant organic materials.
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Affiliation(s)
| | - Andrea Hornemann
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | | | - Felicia Green
- National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom
| | - Paul Gunning
- Smith & Nephew, 101 Hessle Road, Hull, HU3 2BN, United Kingdom
| | - Chiara Portesi
- Quality of Life Division, INRIM, Strada delle Cacce 91, 10135 Torino, Italy
| | - Andrea Rossi
- Quality of Life Division, INRIM, Strada delle Cacce 91, 10135 Torino, Italy
| | - Christian Seim
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | - Rory Steven
- National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom
| | - Bonnie Tyler
- National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom
| | - Burkhard Beckhoff
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
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Abou-Ras D, Caballero R, Streeck C, Beckhoff B, In JH, Jeong S. Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2015; 21:1644-1648. [PMID: 26365537 DOI: 10.1017/s1431927615015093] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
In a recent publication by Abou-Ras et al., various techniques for the analysis of elemental distribution in thin films were compared, using the example of a 2-µm thick Cu(In,Ga)Se2 thin film applied as an absorber material in a solar cell. The authors of this work found that similar relative Ga distributions perpendicular to the substrate across the Cu(In,Ga)Se2 thin film were determined by 18 different techniques, applied on samples from the same identical deposition run. Their spatial and depth resolutions, their measuring speeds, their availabilities, as well as their detection limits were discussed. The present work adds two further techniques to this comparison: laser-induced breakdown spectroscopy and grazing-incidence X-ray fluorescence analysis.
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Affiliation(s)
- Daniel Abou-Ras
- 1Helmholtz-Zentrum Berlin für Materialien und Energie GmbH,Hahn-Meitner-Platz 1,14109 Berlin,Germany
| | - Raquel Caballero
- 1Helmholtz-Zentrum Berlin für Materialien und Energie GmbH,Hahn-Meitner-Platz 1,14109 Berlin,Germany
| | - Cornelia Streeck
- 2Physikalisch-Technische Bundesanstalt,Abbestr. 2-12,10587 Berlin,Germany
| | - Burkhard Beckhoff
- 2Physikalisch-Technische Bundesanstalt,Abbestr. 2-12,10587 Berlin,Germany
| | - Jung-Hwan In
- 3School of Mechatronics,Gwangju Institute of Science and Technology,1 Oryong-dong,Buk-gu,Gwangju 500-712,Republic of Korea
| | - Sungho Jeong
- 3School of Mechatronics,Gwangju Institute of Science and Technology,1 Oryong-dong,Buk-gu,Gwangju 500-712,Republic of Korea
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Dietrich PM, Streeck C, Glamsch S, Ehlert C, Lippitz A, Nutsch A, Kulak N, Beckhoff B, Unger WES. Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination? Anal Chem 2015; 87:10117-24. [DOI: 10.1021/acs.analchem.5b02846] [Citation(s) in RCA: 50] [Impact Index Per Article: 5.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/10/2023]
Affiliation(s)
- P. M. Dietrich
- Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
| | - C. Streeck
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | - S. Glamsch
- Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
- Institut
für Chemie und Biochemie, Freie Universität Berlin, Fabeckstr. 34/36, 14195 Berlin, Germany
| | - C. Ehlert
- Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
- Institut
für Chemie, Universität Potsdam, Karl-Liebknecht-Straße 24-25, 14476 Potsdam, Germany
| | - A. Lippitz
- Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
| | - A. Nutsch
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | - N. Kulak
- Institut
für Chemie und Biochemie, Freie Universität Berlin, Fabeckstr. 34/36, 14195 Berlin, Germany
| | - B. Beckhoff
- Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany
| | - W. E. S. Unger
- Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany
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