1
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Nair S, Yang Z, Storr K, Jalan B. High-Mobility Carriers in Epitaxial IrO 2 Films Grown using Hybrid Molecular Beam Epitaxy. NANO LETTERS 2024; 24:10850-10857. [PMID: 39173119 DOI: 10.1021/acs.nanolett.4c02367] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/24/2024]
Abstract
Binary rutile oxides of 5d metals such as IrO2 stand out in comparison to their 3d and 4d counterparts due to limited experimental studies, despite rich predicted quantum phenomena. Here, we investigate the electrical transport properties of IrO2 by engineering epitaxial thin films grown using hybrid molecular beam epitaxy. Our findings reveal phonon-limited carrier transport and thickness-dependent anisotropic in-plane resistance in IrO2 (110) films, the latter suggesting a complex relationship between strain relaxation and orbital hybridization. Magnetotransport measurements reveal a previously unobserved nonlinear Hall effect. A two-carrier analysis of this effect shows the presence of minority carriers with mobility exceeding 3000 cm2/(V s) at 1.8 K. These results point toward emergent properties in 5d metal oxides that can be controlled using dimensionality and epitaxial strain.
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Affiliation(s)
- Sreejith Nair
- Department of Chemical Engineering and Materials Science, University of Minnesota, Twin Cities, Minneapolis, Minnesota 55455, United States
| | - Zhifei Yang
- Department of Chemical Engineering and Materials Science, University of Minnesota, Twin Cities, Minneapolis, Minnesota 55455, United States
- School of Physics and Astronomy, University of Minnesota, Twin Cities , Minneapolis, Minnesota 55455, United States
| | - Kevin Storr
- Department of Physics, Prairie View A&M University, Prairie View, Texas 77446-0519, United States
| | - Bharat Jalan
- Department of Chemical Engineering and Materials Science, University of Minnesota, Twin Cities, Minneapolis, Minnesota 55455, United States
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2
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Mondal D, Mahapatra SR, Derrico AM, Rai RK, Paudel JR, Schlueter C, Gloskovskii A, Banerjee R, Hariki A, DeGroot FMF, Sarma DD, Narayan A, Nukala P, Gray AX, Aetukuri NPB. Modulation-doping a correlated electron insulator. Nat Commun 2023; 14:6210. [PMID: 37798279 PMCID: PMC10556139 DOI: 10.1038/s41467-023-41816-3] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/31/2023] [Accepted: 09/13/2023] [Indexed: 10/07/2023] Open
Abstract
Correlated electron materials (CEMs) host a rich variety of condensed matter phases. Vanadium dioxide (VO2) is a prototypical CEM with a temperature-dependent metal-to-insulator (MIT) transition with a concomitant crystal symmetry change. External control of MIT in VO2-especially without inducing structural changes-has been a long-standing challenge. In this work, we design and synthesize modulation-doped VO2-based thin film heterostructures that closely emulate a textbook example of filling control in a correlated electron insulator. Using a combination of charge transport, hard X-ray photoelectron spectroscopy, and structural characterization, we show that the insulating state can be doped to achieve carrier densities greater than 5 × 1021 cm-3 without inducing any measurable structural changes. We find that the MIT temperature (TMIT) continuously decreases with increasing carrier concentration. Remarkably, the insulating state is robust even at doping concentrations as high as ~0.2 e-/vanadium. Finally, our work reveals modulation-doping as a viable method for electronic control of phase transitions in correlated electron oxides with the potential for use in future devices based on electric-field controlled phase transitions.
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Affiliation(s)
- Debasish Mondal
- Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, Karnataka, India
| | - Smruti Rekha Mahapatra
- Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, Karnataka, India
| | | | - Rajeev Kumar Rai
- Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore, Karnataka, India
| | - Jay R Paudel
- Department of Physics, Temple University, Philadelphia, PA, USA
| | | | | | - Rajdeep Banerjee
- Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, Karnataka, India
| | - Atsushi Hariki
- Department of Physics and Electronics, Graduate School of Engineering, Osaka Metropolitan University, Osaka, Japan
| | - Frank M F DeGroot
- Utrecht University, Inorganic Chemistry and Catalysis Group Universiteitsweg 99, Utrecht, The Netherlands
| | - D D Sarma
- Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, Karnataka, India
| | - Awadhesh Narayan
- Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, Karnataka, India
| | - Pavan Nukala
- Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore, Karnataka, India
| | - Alexander X Gray
- Department of Physics, Temple University, Philadelphia, PA, USA.
| | - Naga Phani B Aetukuri
- Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, Karnataka, India.
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3
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Vaidya J, Kanthi RSS, Alam S, Amin N, Aziz A, Shukla N. A three-terminal non-volatile ferroelectric switch with an insulator-metal transition channel. Sci Rep 2022; 12:2199. [PMID: 35140259 PMCID: PMC8828903 DOI: 10.1038/s41598-021-03560-w] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/26/2021] [Accepted: 11/22/2021] [Indexed: 11/09/2022] Open
Abstract
Ferroelectrics offer a promising material platform to realize energy-efficient non-volatile memory technology with the FeFET-based implementations being one of the most area-efficient ferroelectric memory architectures. However, the FeFET operation entails a fundamental trade-off between the read and the program operations. To overcome this trade-off, we propose in this work, a novel device concept, Mott-FeFET, that aims to replace the Silicon channel of the FeFET with VO2- a material that exhibits an electrically driven insulator-metal phase transition. The Mott-FeFET design, which demonstrates a (ferroelectric) polarization-dependent threshold voltage, enables the read current distinguishability (i.e., the ratio of current sensed when the Mott-FeFET is in state 1 and 0, respectively) to be independent of the program voltage. This enables the device to be programmed at low voltages without affecting the ability to sense/read the state of the device. Our work provides a pathway to realize low-voltage and energy-efficient non-volatile memory solutions.
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Affiliation(s)
- Jaykumar Vaidya
- Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, 22904, USA
| | - R S Surya Kanthi
- Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, 22904, USA
| | - Shamiul Alam
- Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, TN, 37996, USA
| | - Nazmul Amin
- Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, TN, 37996, USA
| | - Ahmedullah Aziz
- Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, TN, 37996, USA
| | - Nikhil Shukla
- Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, 22904, USA.
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4
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Wang B, Peng R, Wang X, Yang Y, Wang E, Xin Z, Sun Y, Li C, Wu Y, Wei J, Sun J, Liu K. Ultrafast, Kinetically Limited, Ambient Synthesis of Vanadium Dioxides through Laser Direct Writing on Ultrathin Chalcogenide Matrix. ACS NANO 2021; 15:10502-10513. [PMID: 34009934 DOI: 10.1021/acsnano.1c03050] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Vanadium dioxide (VO2) is a strongly correlated electronic material and has attracted significant attention due to its metal-to-insulator transition and diverse smart applications. Traditional synthesis of VO2 usually requires minutes or hours of global heating and low oxygen partial pressure to achieve thermodynamic control of the valence state. Further patterning of VO2 through a series of lithography and etching processes may inevitably change its surface valence, which poses a great challenge for the assembly of micro- and nanoscale VO2-based heterojunction devices. Herein, we report an ultrafast method to simultaneously synthesize and pattern VO2 on the time scale of seconds under ambient conditions through laser direct writing on a V5S8 "canvas". The successful ambient synthesis of VO2 is attributed to the ultrafast local heating and cooling process, resulting in controlled freezing of the intermediate oxidation phase during the relatively long kinetic reaction. A Mott memristor based on a V5S8-VO2-V5S8 lateral heterostructure can be fabricated and integrated with a MoS2 channel, delivering a transistor with abrupt switching transfer characteristics. The other device with a VSxOy channel exhibits a large negative temperature coefficient of approximately 4.5%/K, which is highly desirable for microbolometers. The proposed approach enables fast and efficient integration of VO2-based heterojunction devices and is applicable to other intriguing intermediate phases of oxides.
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Affiliation(s)
- Bolun Wang
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Ruixuan Peng
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Xuewen Wang
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Yueyang Yang
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Enze Wang
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Zeqin Xin
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Yufei Sun
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Chenyu Li
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Yonghuang Wu
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Jinquan Wei
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Jingbo Sun
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
| | - Kai Liu
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
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5
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Yamamoto M, Nouchi R, Kanki T, Nakaharai S, Hattori AN, Watanabe K, Taniguchi T, Wakayama Y, Ueno K, Tanaka H. Barrier Formation at the Contacts of Vanadium Dioxide and Transition-Metal Dichalcogenides. ACS APPLIED MATERIALS & INTERFACES 2019; 11:36871-36879. [PMID: 31525896 DOI: 10.1021/acsami.9b13763] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Phase-transition field-effect transistors (FETs) are a class of steep-slope devices that show abrupt on/off switching owing to the metal-insulator transition (MIT) induced in the contacting materials. An important avenue to develop phase-transition FETs is to understand the charge injection mechanism at the junction of the contacting MIT materials and semiconductor channels. Here, toward the realization of high-performance phase-transition FETs, we investigate the contact properties of heterojunctions between semiconducting transition-metal dichalcogenides (TMDCs) and vanadium dioxide (VO2) that undergoes a MIT at a critical temperature (Tc) of approximately 340 K. We fabricated transistors based on molybdenum disulfide (MoS2) and tungsten diselenide (WSe2) in contact with the VO2 source/drain electrodes. The VO2-contacted MoS2 transistor exhibited n-type transport both below and above Tc. Across the MIT, the on-current was observed to increase only by a factor of 5, in contrast to the order-of-magnitude change in the resistance of the VO2 electrodes, suggesting the existence of high contact resistance. The Arrhenius analyses of the gate-dependent drain current confirmed the formation of the interfacial barrier at the VO2/MoS2 contacts, irrespective of the phase state of VO2. The VO2-contacted WSe2 transistor showed ambipolar transport, indicating that the Fermi level lies near the mid gap of WSe2. These observations provide insights into the contact properties of phase-transition FETs based on VO2 and TMDCs and suggest the need for contact engineering for high-performance operations.
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Affiliation(s)
- Mahito Yamamoto
- Institute of Scientific and Industrial Research , Osaka University , Ibaraki , Osaka 567-0047 , Japan
| | - Ryo Nouchi
- Graduate School of Engineering , Osaka Prefecture University , Sakai , Osaka 599-8570 , Japan
- JST PRESTO , Kawaguchi , Saitama 332-0012 , Japan
| | - Teruo Kanki
- Institute of Scientific and Industrial Research , Osaka University , Ibaraki , Osaka 567-0047 , Japan
| | - Shu Nakaharai
- National Institute for Materials Science , Tsukuba , Ibaraki 305-0044 , Japan
| | - Azusa N Hattori
- Institute of Scientific and Industrial Research , Osaka University , Ibaraki , Osaka 567-0047 , Japan
| | - Kenji Watanabe
- National Institute for Materials Science , Tsukuba , Ibaraki 305-0044 , Japan
| | - Takashi Taniguchi
- National Institute for Materials Science , Tsukuba , Ibaraki 305-0044 , Japan
| | - Yutaka Wakayama
- National Institute for Materials Science , Tsukuba , Ibaraki 305-0044 , Japan
| | - Keiji Ueno
- Department of Chemistry, Graduate School of Science and Engineering , Saitama University , Saitama 338-8570 , Japan
| | - Hidekazu Tanaka
- Institute of Scientific and Industrial Research , Osaka University , Ibaraki , Osaka 567-0047 , Japan
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6
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Moatti A, Sachan R, Gupta S, Narayan J. Vacancy-Driven Robust Metallicity of Structurally Pinned Monoclinic Epitaxial VO 2 Thin Films. ACS APPLIED MATERIALS & INTERFACES 2019; 11:3547-3554. [PMID: 30590009 DOI: 10.1021/acsami.8b17879] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Vanadium dioxide (VO2) is a strongly correlated material with 3d electrons, which exhibits temperature-driven insulator-to-metal transition with a concurrent change in the crystal symmetry. Interestingly, even modest changes in stoichiometry-induced orbital occupancy dramatically affect the electrical conductivity of the system. Here, we report a successful transformation of epitaxial monoclinic VO2 thin films from a conventionally insulating to permanently metallic behavior by manipulating the electron correlations. These ultrathin (∼10 nm) epitaxial VO2 films were grown on NiO(111)/Al2O3(0001) pseudomorphically, where the large misfit between NiO and Al2O3 were fully relaxed by domain-matching epitaxy. Complete conversion from an insulator to permanent metallic phase is achieved through injecting oxygen vacancies ( x ∼ 0.20 ± 0.02) into the VO2- x system via annealing under high vacuum (∼5 × 10-7 Torr) and increased temperature (450 °C). Systematic introduction of oxygen vacancies partially converts V4+ to V3+ and generates unpaired electron charges which result in the emergence of donor states near the Fermi level. Through the detailed study of the vibrational modes by Raman spectroscopy, hardening of the V-V vibrational modes and stabilization of V-V dimers are observed in vacuum-annealed VO2 films, providing conclusive evidence for stabilization of a monoclinic phase. This ultimately leads to convenient free-electron transport through the oxygen-deficient VO2- x thin films, resulting in metallic characteristics at room temperature. With these results, we propose a defect engineering pathway through the control of oxygen vacancies to tune electrical and optical properties in epitaxial monoclinic VO2.
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Affiliation(s)
- Adele Moatti
- Materials Science and Engineering , North Carolina State University , Raleigh , North Carolina 27606 , United States
| | - Ritesh Sachan
- Materials Science and Engineering , North Carolina State University , Raleigh , North Carolina 27606 , United States
- Materials Science Division , Army Research Office , Research Triangle Park , Raleigh , North Carolina 27709 , United States
| | - Siddharth Gupta
- Materials Science and Engineering , North Carolina State University , Raleigh , North Carolina 27606 , United States
| | - Jagdish Narayan
- Materials Science and Engineering , North Carolina State University , Raleigh , North Carolina 27606 , United States
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7
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Chen Y, Zhang Y, Wang Z, Zhan T, Wang YC, Zou H, Ren H, Zhang G, Zou C, Wang ZL. Dynamic Electronic Doping for Correlated Oxides by a Triboelectric Nanogenerator. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018; 30:e1803580. [PMID: 30239043 DOI: 10.1002/adma.201803580] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/06/2018] [Revised: 08/25/2018] [Indexed: 06/08/2023]
Abstract
The metal-insulator transition of vanadium dioxide (VO2 ) is exceptionally sensitive to charge density and electron orbital occupancy. Thus three-terminal field-effect transistors with VO2 channels are widely adopted to control the phase transition by external gating voltage. However, current leakage, electrical breakdown, or interfacial electrochemical reactions may be inevitable if conventional solid dielectrics or ionic-liquid layers are used, which possibly induce Joule heating or doping in the VO2 layer and make the voltage-controlled phase transition more complex. Here, a triboelectric nanogenerator (TENG) and a VO2 film are combined for a novel TENG-VO2 device, which can overcome the abovementioned challenges and achieve electron-doping-induced phase modulation. By taking advantage of the TENG structure, electrons can be induced in the VO2 channel and thus adjust the electronic states of the VO2 , simultaneously. The modulation degree of the VO2 resistance depends on the temperature, and the major variation occurs when the temperature is in the phase-transition region. The accumulation of electrons in the VO2 channel also is simulated by finite element analysis, and the electron doping mechanism is verified by theoretical calculations. The results provide a promising approach to develop a novel type of tribotronic transistor and new electronic doping technology.
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Affiliation(s)
- Yuliang Chen
- School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0245, USA
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, 230029, China
| | - Ying Zhang
- School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0245, USA
- Key Laboratory of Thermo-Fluid Science and Engineering, Ministry of Education, Xi'an Jiaotong University, Xi'an, 710049, China
| | - Zhaowu Wang
- School of Physics and Engineering, Henan Key Laboratory of Photoelectric Energy Storage Materials and Applications, Henan University of Science and Technology, Luoyang, 471023, China
- National Laboratory of Solid State Microstructures, Nanjing University, Nanjing, 210093, China
| | - Taotao Zhan
- Key Laboratory of Thermo-Fluid Science and Engineering, Ministry of Education, Xi'an Jiaotong University, Xi'an, 710049, China
| | - Yi-Cheng Wang
- School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0245, USA
- Department of Food Science and Human Nutrition, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA
| | - Haiyang Zou
- School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0245, USA
| | - Hui Ren
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, 230029, China
| | - Guobin Zhang
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, 230029, China
| | - Chongwen Zou
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, 230029, China
| | - Zhong Lin Wang
- School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0245, USA
- Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 100085, China
- College of Nanoscience and Technology, University of Chinese Academy of Sciences, Beijing, 100049, China
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8
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Wei T, Kanki T, Chikanari M, Uemura T, Sekitani T, Tanaka H. Enhanced electronic-transport modulation in single-crystalline VO 2 nanowire-based solid-state field-effect transistors. Sci Rep 2017; 7:17215. [PMID: 29222452 PMCID: PMC5722937 DOI: 10.1038/s41598-017-17468-x] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/18/2017] [Accepted: 11/27/2017] [Indexed: 11/09/2022] Open
Abstract
Field-effect transistors using correlated electron materials with an electronic phase transition pave a new avenue to realize steep slope switching, to overcome device size limitations and to investigate fundamental science. Here, we present a new finding in gate-bias-induced electronic transport switching in a correlated electron material, i.e., a VO2 nanowire channel through a hybrid gate, which showed an enhancement in the resistive modulation efficiency accompanied by expansion of metallic nano-domains in an insulating matrix by applying gate biases near the metal-insulator transition temperature. Our results offer an understanding of the innate ability of coexistence state of metallic and insulating domains in correlated materials through carrier tuning and serve as a valuable reference for further research into the development of correlated materials and their devices.
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Affiliation(s)
- Tingting Wei
- Institute of Scientific and Industrial Research, Osaka Universit, Ibaraki, Osaka, 567-0047, Japan.,Faculty of Science, Kunming University of Science and Technology, Kunming, 650093, China
| | - Teruo Kanki
- Institute of Scientific and Industrial Research, Osaka Universit, Ibaraki, Osaka, 567-0047, Japan.
| | - Masashi Chikanari
- Institute of Scientific and Industrial Research, Osaka Universit, Ibaraki, Osaka, 567-0047, Japan
| | - Takafumi Uemura
- Institute of Scientific and Industrial Research, Osaka Universit, Ibaraki, Osaka, 567-0047, Japan
| | - Tsuyoshi Sekitani
- Institute of Scientific and Industrial Research, Osaka Universit, Ibaraki, Osaka, 567-0047, Japan
| | - Hidekazu Tanaka
- Institute of Scientific and Industrial Research, Osaka Universit, Ibaraki, Osaka, 567-0047, Japan.
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9
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Xue W, Liu G, Zhong Z, Dai Y, Shang J, Liu Y, Yang H, Yi X, Tan H, Pan L, Gao S, Ding J, Xu XH, Li RW. A 1D Vanadium Dioxide Nanochannel Constructed via Electric-Field-Induced Ion Transport and its Superior Metal-Insulator Transition. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2017; 29:1702162. [PMID: 28833612 DOI: 10.1002/adma.201702162] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/17/2017] [Revised: 06/02/2017] [Indexed: 05/27/2023]
Abstract
Nanoscale manipulation of materials' physicochemical properties offers distinguished possibility to the development of novel electronic devices with ultrasmall dimension, fast operation speed, and low energy consumption characteristics. This is especially important as the present semiconductor manufacturing technique is approaching the end of miniaturization campaign in the near future. Here, a superior metal-insulator transition (MIT) of a 1D VO2 nanochannel constructed through an electric-field-induced oxygen ion migration process in V2 O5 thin film is reported for the first time. A sharp and reliable MIT transition with a steep turn-on voltage slope of <0.5 mV dec-1 , fast switching speed of 17 ns, low energy consumption of 8 pJ, and low variability of <4.3% is demonstrated in the VO2 nanochannel device. High-resolution transmission electron microscopy observation and theoretical computation verify that the superior electrical properties of the present device can be ascribed to the electroformation of nanoscale VO2 nanochannel in V2 O5 thin films. More importantly, the incorporation of the present device into a Pt/HfO2 /Pt/VO2 /Pt 1S1R unit can ensure the correct reading of the HfO2 memory continuously for 107 cycles, therefore demonstrating its great possibility as a reliable selector in high-density crossbar memory arrays.
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Affiliation(s)
- Wuhong Xue
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Key Laboratory of Magnetic Molecules and Magnetic Information Materials of Ministry of Education, School of Chemistry and Materials Science, Shanxi Normal University, Linfen, Shanxi, 041004, China
| | - Gang Liu
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Zhicheng Zhong
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Yuehua Dai
- Institute of Electronic and Information Project, Anhui University, Hefei, Anhui, 230601, China
| | - Jie Shang
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Yiwei Liu
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Huali Yang
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Xiaohui Yi
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Hongwei Tan
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Liang Pan
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Shuang Gao
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Jun Ding
- Department of Materials Science and Engineering, National University of Singapore, Singapore, 119260, Singapore
| | - Xiao-Hong Xu
- Key Laboratory of Magnetic Molecules and Magnetic Information Materials of Ministry of Education, School of Chemistry and Materials Science, Shanxi Normal University, Linfen, Shanxi, 041004, China
| | - Run-Wei Li
- Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
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10
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Fisher B, Patlagan L. Switching VO₂ Single Crystals and Related Phenomena: Sliding Domains and Crack Formation. MATERIALS 2017; 10:ma10050554. [PMID: 28772918 PMCID: PMC5459034 DOI: 10.3390/ma10050554] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/24/2017] [Revised: 05/09/2017] [Accepted: 05/11/2017] [Indexed: 11/16/2022]
Abstract
VO2 is the prototype material for insulator–metal transition (IMT). Its transition at TIMT = 340 K is fast and consists of a large resistance jump (up to approximately five orders of magnitude), a large change in its optical properties in the visible range, and symmetry change from monoclinic to tetragonal (expansion by 1% along the tetragonal c-axis and 0.5% contraction in the perpendicular direction). It is a candidate for potential applications such as smart windows, fast optoelectronic switches, and field-effect transistors. The change in optical properties at the IMT allows distinguishing between the insulating and the metallic phases in the mixed state. Static or dynamic domain patterns in the mixed-state of self-heated single crystals during electric-field induced switching are in strong contrast with the percolative nature of the mixed state in switching VO2 films. The most impressive effect—so far unique to VO2—is the sliding of narrow semiconducting domains within a metallic background in the positive sense of the electric current. Here we show images from videos obtained using optical microscopy for sliding domains along VO2 needles and confirm a relation suggested in the past for their velocity. We also show images for the disturbing damage induced by the structural changes in switching VO2 crystals obtained for only a few current–voltage cycles.
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Vitale WA, Casu EA, Biswas A, Rosca T, Alper C, Krammer A, Luong GV, Zhao QT, Mantl S, Schüler A, Ionescu AM. A Steep-Slope Transistor Combining Phase-Change and Band-to-Band-Tunneling to Achieve a sub-Unity Body Factor. Sci Rep 2017; 7:355. [PMID: 28336970 PMCID: PMC5428222 DOI: 10.1038/s41598-017-00359-6] [Citation(s) in RCA: 37] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/22/2016] [Accepted: 02/21/2017] [Indexed: 11/24/2022] Open
Abstract
Steep-slope transistors allow to scale down the supply voltage and the energy per computed bit of information as compared to conventional field-effect transistors (FETs), due to their sub-60 mV/decade subthreshold swing at room temperature. Currently pursued approaches to achieve such a subthermionic subthreshold swing consist in alternative carrier injection mechanisms, like quantum mechanical band-to-band tunneling (BTBT) in Tunnel FETs or abrupt phase-change in metal-insulator transition (MIT) devices. The strengths of the BTBT and MIT have been combined in a hybrid device architecture called phase-change tunnel FET (PC-TFET), in which the abrupt MIT in vanadium dioxide (VO2) lowers the subthreshold swing of strained-silicon nanowire TFETs. In this work, we demonstrate that the principle underlying the low swing in the PC-TFET relates to a sub-unity body factor achieved by an internal differential gate voltage amplification. We study the effect of temperature on the switching ratio and the swing of the PC-TFET, reporting values as low as 4.0 mV/decade at 25 °C, 7.8 mV/decade at 45 °C. We discuss how the unique characteristics of the PC-TFET open new perspectives, beyond FETs and other steep-slope transistors, for low power electronics, analog circuits and neuromorphic computing.
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Affiliation(s)
- Wolfgang A Vitale
- Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland.
| | - Emanuele A Casu
- Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
| | - Arnab Biswas
- Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
| | - Teodor Rosca
- Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
| | - Cem Alper
- Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
| | - Anna Krammer
- Solar Energy and Building Physics Laboratory (LESO-PB), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
| | - Gia V Luong
- Peter Grünberg Institut 9 (PGI-9), Forschungszentrum Jülich, 52425, Jülich, Germany
| | - Qing-T Zhao
- Peter Grünberg Institut 9 (PGI-9), Forschungszentrum Jülich, 52425, Jülich, Germany
| | - Siegfried Mantl
- Peter Grünberg Institut 9 (PGI-9), Forschungszentrum Jülich, 52425, Jülich, Germany
| | - Andreas Schüler
- Solar Energy and Building Physics Laboratory (LESO-PB), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
| | - A M Ionescu
- Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
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Current induced polycrystalline-to-crystalline transformation in vanadium dioxide nanowires. Sci Rep 2016; 6:37296. [PMID: 27892519 PMCID: PMC5125010 DOI: 10.1038/srep37296] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/03/2016] [Accepted: 10/27/2016] [Indexed: 11/09/2022] Open
Abstract
Vanadium dioxide (VO2) exhibits a reversible insulator-metal phase transition that is of significant interest in energy-efficient nanoelectronic and nanophotonic devices. In these applications, crystalline materials are usually preferred for their superior electrical transport characteristics as well as spatial homogeneity and low surface roughness over the device area for reduced scattering. Here, we show applied electrical currents can induce a permanent reconfiguration of polycrystalline VO2 nanowires into crystalline nanowires, resulting in a dramatically reduced hysteresis across the phase transition and reduced resistivity. Low currents below 3 mA were sufficient to cause the local temperature in the VO2 to reach about 1780 K to activate the irreversible polycrystalline-to-crystalline transformation. The crystallinity was confirmed by electron microscopy and diffraction analyses. This simple yet localized post-processing of insulator-metal phase transition materials may enable new methods of studying and fabricating nanoscale structures and devices formed from these materials.
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Yoon J, Kim H, Chen X, Tamura N, Mun BS, Park C, Ju H. Controlling the Temperature and Speed of the Phase Transition of VO2 Microcrystals. ACS APPLIED MATERIALS & INTERFACES 2016; 8:2280-2286. [PMID: 26713678 DOI: 10.1021/acsami.5b11144] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
We investigated the control of two important parameters of vanadium dioxide (VO2) microcrystals, the phase transition temperature and speed, by varying microcrystal width. By using the reflectivity change between insulating and metallic phases, phase transition temperature is measured by optical microscopy. As the width of square cylinder-shaped microcrystals decreases from ∼70 to ∼1 μm, the phase transition temperature (67 °C for bulk) varied as much as 26.1 °C (19.7 °C) during heating (cooling). In addition, the propagation speed of phase boundary in the microcrystal, i.e., phase transition speed, is monitored at the onset of phase transition by using the high-speed resistance measurement. The phase transition speed increases from 4.6 × 10(2) to 1.7 × 10(4) μm/s as the width decreases from ∼50 to ∼2 μm. While the statistical description for a heterogeneous nucleation process explains the size dependence on phase transition temperature of VO2, the increase of effective thermal exchange process is responsible for the enhancement of phase transition speed of small VO2 microcrystals. Our findings not only enhance the understanding of VO2 intrinsic properties but also contribute to the development of innovative electronic devices.
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Affiliation(s)
- Joonseok Yoon
- Department of Physics, Yonsei University , Seoul 03722, Republic of Korea
| | - Howon Kim
- Department of Physics, Yonsei University , Seoul 03722, Republic of Korea
| | - Xian Chen
- Department of Mechanical and Aerospace Engineering, The Hong Kong University of Science and Technology , Hong Kong 999077, China
| | - Nobumichi Tamura
- Advanced Light Source, Lawrence Berkeley National Laboratory , Berkeley, California 94720, United States
| | | | - Changwoo Park
- Division of Applied Chemistry and Biotechnology, Hanbat National University , Daejeon 34158, Republic of Korea
- Advanced Nano Products , Sejong, 30077, Republic of Korea
| | - Honglyoul Ju
- Department of Physics, Yonsei University , Seoul 03722, Republic of Korea
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