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Zhang H, Sui T, Salvati E, Daisenberger D, Lunt AJG, Fong KS, Song X, Korsunsky AM. Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation. MATERIALS 2018; 11:ma11030427. [PMID: 29543728 PMCID: PMC5873006 DOI: 10.3390/ma11030427] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/19/2018] [Revised: 03/11/2018] [Accepted: 03/12/2018] [Indexed: 11/16/2022]
Abstract
High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the 'caking' (radial binning) or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short). As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional 'caking' with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated using multiple direction strain data, leading to full in-plane strain evaluation. It is therefore concluded that XRD-DIC provides a reliable and robust method for strain evaluation from 2D powder diffraction data. The XRD-DIC approach simplifies the analysis process by skipping 2D to 1D conversion, and opens new possibilities for robust 2D powder diffraction data analysis for full in-plane strain evaluation.
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Affiliation(s)
- Hongjia Zhang
- Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK.
| | - Tan Sui
- Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK.
- Department of Mechanical Engineering Sciences, University of Surrey, Guildford GU2 7XH, UK.
| | - Enrico Salvati
- Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK.
| | | | - Alexander J G Lunt
- Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK.
- CERN, CH-1211 Geneva 23, Switzerland.
| | - Kai Soon Fong
- Singapore Institute of Manufacturing Technology (SIMTech), 73 Nanyang Drive, Singapore 637662, Singapore.
| | - Xu Song
- Singapore Institute of Manufacturing Technology (SIMTech), 73 Nanyang Drive, Singapore 637662, Singapore.
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Bertram F, Deiter C, Pflaum K, Seeck OH. A compact high vacuum heating chamber for in-situ x-ray scattering studies. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2012; 83:083904. [PMID: 22938311 DOI: 10.1063/1.4746290] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
A very compact multi purpose high vacuum heating chamber for x-ray scattering techniques was developed. The compact design allows the chamber to be installed on high precision diffractometers which usually cannot support heavy and/or large equipment. The chamber is covered by a Be dome allowing full access to the hemisphere above the sample which is required for in-plane grazing incident x-ray diffraction and out-off plane wide angle x-ray diffraction.
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Affiliation(s)
- F Bertram
- Hamburger Synchrotronstrahlungslabor am Deutschen Elektronen-Synchrotron, Notkestr. 85, 22607 Hamburg, Germany.
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Moras P, Carbone C. Quantum well band formation in Ag films on InSb(111). JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2009; 21:355502. [PMID: 21828637 DOI: 10.1088/0953-8984/21/35/355502] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Room temperature deposition of Ag on InSb(111) is known to lead to three-dimensional clustering, without long-range crystalline order. We show by means of angle-resolved photoemission that 'two-step' growth in which the films are annealed to room temperature after low temperature deposition results in the formation of Ag films which are epitaxial, atomically flat, and display a quasi-discrete quantum well band structure. Core level analysis highlights different chemical interactions between the substrate and deposited materials for room temperature and 'two-step' Ag growth.
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Affiliation(s)
- P Moras
- Istituto di Struttura della Materia, Consiglio Nazionale delle Ricerche, Trieste, Italy
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Nakaguchi A, Guo FZ, Hashimoto M, Ueda M, Yasue T, Matsushita T, Tamenori Y, Kinoshita T, Kobayashi K, Koshikawa T. Sb on In/Si(111) processes with dynamically observable LEEM, selected area LEED and chemically analyzed SR-XPEEM. SURF INTERFACE ANAL 2006. [DOI: 10.1002/sia.2502] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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Mishima TD, Naruse N, Cho SP, Kadohira T, Osaka T. Direct imaging of the InSb001-c8 x 2 surface: evidence for large anisotropy of the reconstruction. PHYSICAL REVIEW LETTERS 2002; 89:276105. [PMID: 12513224 DOI: 10.1103/physrevlett.89.276105] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/23/2002] [Indexed: 05/24/2023]
Abstract
We have observed the InSb(001)-c(8 x 2) surface by using high-resolution transmission electron microscopy in the profile-imaging geometry. All images observed at temperatures up to 420 degrees C agree well with the c(8 x 2) model reported by Kumpf et al. [Phys. Rev. Lett. 86, 3586 (2001)]]. 1/30 sec real-time observations at 420 degrees C evidence that a part of the subsurface and surface layers (called a gull-type segment) undergo switching to and from a bulk configuration. The finding is suggestive of large anisotropy in the mean square displacement of the c(8 x 2) surface.
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Affiliation(s)
- T D Mishima
- Kagami Memorial Laboratory for Materials Science and Technology, Waseda University, Nishiwaseda, Shinjuku-ku, Tokyo 169-0051, Japan
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Ohtake A, Nakamura J, Eguchi T, Osaka T. Geometry and lattice formation of surface layers of Sn growing on InSb{111}A,B. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 54:10358-10361. [PMID: 9984823 DOI: 10.1103/physrevb.54.10358] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Kim JW, Kim S, Seo JM, Tanaka S, Kamada M. Surface core-level shift of InSb(111)-2 x 2. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 54:4476-4479. [PMID: 9986400 DOI: 10.1103/physrevb.54.4476] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Duke CB. Semiconductor Surface Reconstruction: The Structural Chemistry of Two-Dimensional Surface Compounds. Chem Rev 1996; 96:1237-1260. [PMID: 11848788 DOI: 10.1021/cr950212s] [Citation(s) in RCA: 80] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Affiliation(s)
- Charles B. Duke
- Xerox Wilson Center for Research and Technology, 800 Phillips Road 0114-38D, Webster, New York 14580
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Olsson LÖ, Ilver L, Kanski J, Nilsson PO, Andersson CB, Karlsson UO, Håkansson MC. Core level and valence-band studies of the (111)2 x 2 surfaces of InSb and InAs. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 53:4734-4740. [PMID: 9984034 DOI: 10.1103/physrevb.53.4734] [Citation(s) in RCA: 22] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Yamamoto K, Kobayashi K. Electronic structure and EPC stability of the alpha -Sn/InSb(111)A nonpolar-polar heterojunction interface. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 53:4539-4543. [PMID: 9984009 DOI: 10.1103/physrevb.53.4539] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Surface Structures of Elemental and Compound Semiconductors. ACTA ACUST UNITED AC 1996. [DOI: 10.1016/s1573-4331(96)80011-4] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
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Saito M, Kosaka T, Matsubara E, Waseda Y. Characterization of Oxide Film Grown on Stainless Steel by a New In-House Grazing Incidence X-ray Scattering (GIXS) Apparatus. ACTA ACUST UNITED AC 1995. [DOI: 10.2320/matertrans1989.36.1] [Citation(s) in RCA: 20] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/01/2022]
Affiliation(s)
- Masatoshi Saito
- Institute for Advanced Materials Processing, Tohoku University
| | - Tomomi Kosaka
- Institute for Advanced Materials Processing, Tohoku University
| | - Eiichiro Matsubara
- Department of Materials Science and Engineering, Graduate School, Kyoto University
| | - Yoshio Waseda
- Institute for Advanced Materials Processing, Tohoku University
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Olsson LÖ, Kanski J, Ilver L, Andersson CB, Björkqvist M, Göthelid M, Karlsson UO, Håkansson MC. Surface electronic structure of InSb(1-bar 1-bar 1-bar)3 x 3 studied by angle-resolved photoelectron spectroscopy and scanning tunneling microscopy. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 50:18172-18178. [PMID: 9976250 DOI: 10.1103/physrevb.50.18172] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Osaka T, Omi H, Yamamoto K, Ohtake A. Surface phase transition and interface interaction in the alpha -Sn/InSb{111} system. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 50:7567-7572. [PMID: 9974738 DOI: 10.1103/physrevb.50.7567] [Citation(s) in RCA: 57] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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Omi H, Saito H, Osaka T. Polarity propagation in the InSb/ alpha -Sn/InSb heterostructure. PHYSICAL REVIEW LETTERS 1994; 72:2596-2599. [PMID: 10055924 DOI: 10.1103/physrevlett.72.2596] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Howes PB, Norris C, Finney MS, Vlieg E. Structure of Ge(111) sqrt 3 x sqrt 3 R30 degrees-Au determined by surface x-ray diffraction. PHYSICAL REVIEW. B, CONDENSED MATTER 1993; 48:1632-1642. [PMID: 10008524 DOI: 10.1103/physrevb.48.1632] [Citation(s) in RCA: 23] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Wang J, Ocko BM, Davenport AJ, Isaacs HS. In situ x-ray-diffraction and -reflectivity studies of the Au(111)/electrolyte interface: Reconstruction and anion adsorption. PHYSICAL REVIEW. B, CONDENSED MATTER 1992; 46:10321-10338. [PMID: 10002877 DOI: 10.1103/physrevb.46.10321] [Citation(s) in RCA: 128] [Impact Index Per Article: 3.9] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Nakada T, Osaka T. Sb trimer structure of the InSb(111)B-(2 x 2) surface as determined by transmission electron diffraction. PHYSICAL REVIEW LETTERS 1991; 67:2834-2837. [PMID: 10044567 DOI: 10.1103/physrevlett.67.2834] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Jiang DT, Crozier ED, Heinrich B. Structure determination of metastable epitaxial Cu layers on Ag(001) by glancing-incidence x-ray-absorption fine structure. PHYSICAL REVIEW. B, CONDENSED MATTER 1991; 44:6401-6409. [PMID: 9998505 DOI: 10.1103/physrevb.44.6401] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Surfaces of Compound Semiconductors. ACTA ACUST UNITED AC 1991. [DOI: 10.1007/978-3-662-02714-1_5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
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Whitman LJ, Stroscio JA, Dragoset RA, Celotta RJ. Scanning-tunneling-microscopy study of InSb(110). PHYSICAL REVIEW. B, CONDENSED MATTER 1990; 42:7288-7291. [PMID: 9994868 DOI: 10.1103/physrevb.42.7288] [Citation(s) in RCA: 27] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Toney MF, Thompson C. X‐ray reflectivity on perfluoropolyether polymer molecules on amorphous carbon. J Chem Phys 1990. [DOI: 10.1063/1.457836] [Citation(s) in RCA: 45] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022] Open
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Zabinska K, Zielinski P. Relaxed structure of two-atom crystals with surfaces. PHYSICAL REVIEW. B, CONDENSED MATTER 1989; 40:12071-12078. [PMID: 9991835 DOI: 10.1103/physrevb.40.12071] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Newsam JM, Liang KS. Synchrotron X-ray diffraction studies of inorganic materials and heterogeneous catalysts. INT REV PHYS CHEM 1989. [DOI: 10.1080/01442358909353232] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/21/2022]
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Sauvage-Simkin M, Pinchaux R, Massies J, Claverie P, Jedrecy N, Bonnet J, Robinson IK. Fractional stoichiometry of the GaAs(001)c(4 x 4) surface: An in-situ x-ray scattering study. PHYSICAL REVIEW LETTERS 1989; 62:563-566. [PMID: 10040267 DOI: 10.1103/physrevlett.62.563] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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31
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Melroy O, Toney M, Borges G, Samant M, Kortright J, Ross P, Blum L. An in-situ grazing incidence X-ray scattering study of the initial stages of electrochemical growth of lead on silver (111). ACTA ACUST UNITED AC 1989. [DOI: 10.1016/0022-0728(89)85124-1] [Citation(s) in RCA: 55] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
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Melroy OR, Toney MF, Borges GL, Samant MG, Kortright JB, Ross PN, Blum L. Two-dimensional compressibility of electrochemically adsorbed lead on silver (111). PHYSICAL REVIEW. B, CONDENSED MATTER 1988; 38:10962-10965. [PMID: 9945968 DOI: 10.1103/physrevb.38.10962] [Citation(s) in RCA: 31] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Gibbs D, Ocko BM, Zehner DM, Mochrie SG. Absolute x-ray reflectivity study of the Au(100) surface. PHYSICAL REVIEW. B, CONDENSED MATTER 1988; 38:7303-7310. [PMID: 9945452 DOI: 10.1103/physrevb.38.7303] [Citation(s) in RCA: 61] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Altman MS, Estrup PJ, Robinson IK. Multilayer reconstruction of the W(001) surface. PHYSICAL REVIEW. B, CONDENSED MATTER 1988; 38:5211-5214. [PMID: 9946954 DOI: 10.1103/physrevb.38.5211] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Robinson IK, Waskiewicz WK, Fuoss PH, Norton LJ. Observation of strain in the Si(111) 7 x 7 surface. PHYSICAL REVIEW. B, CONDENSED MATTER 1988; 37:4325-4328. [PMID: 9945085 DOI: 10.1103/physrevb.37.4325] [Citation(s) in RCA: 52] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Prewitt CT, Coppens P, Phillips JC, Finger LW. New Opportunities in Synchrotron X-ray Crystallography. Science 1987; 238:312-9. [PMID: 17837115 DOI: 10.1126/science.238.4825.312] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/02/2022]
Abstract
Several high-intensity synchrotron x-ray sources have been constructed over the past few years in the United States, West Germany, Great Britain, Japan, France, Italy, and the Soviet Union. Crystallographers have begun to use these facilities for experiments that take advantage of the characteristics of synchrotron radiation, namely, a broad distribution of wavelengths, high intensity, low divergence, strong polarization, and a pulsed time structure. In addition to more familiar diffraction experiments on single crystals and powdered samples, new types of crystallographic studies, for example, energy-dispersive and surface diffraction studies, have progressed rapidly with more general accessibility of synchrotron sources. These high-intensity sources allow diffraction experiments to be performed on very small crystals or on large biological molecules, and permit weak magnetic scattering to be detected Anomalous dispersion experiments can exploit he ability to vary the wavelength of the radiation, and the pulsed time structure of the beam makes possible fast time-resolved experiments. Because of the availability of synchrotron x-radiation, these and other kinds of experiments will be in the forefront of crystallographic research for the next several years.
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Kaxiras E, Bar-Yam Y, Joannopoulos JD, Pandey KC. Ab initio theory of polar semiconductor surfaces. II. (22) reconstructions and related phase transitions of GaAs(1-bar1-bar1-bar). PHYSICAL REVIEW. B, CONDENSED MATTER 1987; 35:9636-9643. [PMID: 9941390 DOI: 10.1103/physrevb.35.9636] [Citation(s) in RCA: 30] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Kaxiras E, Bar-Yam Y, Joannopoulos JD, Pandey KC. Ab initio theory of polar semiconductor surfaces. I. Methodology and the (22) reconstructions of GaAs(111). PHYSICAL REVIEW. B, CONDENSED MATTER 1987; 35:9625-9635. [PMID: 9941389 DOI: 10.1103/physrevb.35.9625] [Citation(s) in RCA: 67] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Dosch H. Evanescent absorption in kinematic surface Bragg diffraction. PHYSICAL REVIEW. B, CONDENSED MATTER 1987; 35:2137-2143. [PMID: 9941661 DOI: 10.1103/physrevb.35.2137] [Citation(s) in RCA: 68] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Robinson IK, Waskiewicz WK, Tung RT, Bohr J. Ordering at Si(111)/a-Si and Si(111)/SiO2 interfaces. PHYSICAL REVIEW LETTERS 1986; 57:2714-2717. [PMID: 10033842 DOI: 10.1103/physrevlett.57.2714] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Chadi DJ. Atomic structure of the (2 x 2) reconstructed GaAs(1-bar1-bar1-bar) surface: A multivacancy model. PHYSICAL REVIEW LETTERS 1986; 57:102-105. [PMID: 10033368 DOI: 10.1103/physrevlett.57.102] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Bohr J, Feidenhans'l R, Nielsen M, Toney M, Johnson RL, Robinson IK. Bohr et al. respond. PHYSICAL REVIEW LETTERS 1986; 56:2878. [PMID: 10033119 DOI: 10.1103/physrevlett.56.2878] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Yang WS, Zhao RG. Model-independent structure determination of the InSb(111)2 x 2 surface. PHYSICAL REVIEW LETTERS 1986; 56:2877. [PMID: 10033118 DOI: 10.1103/physrevlett.56.2877] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Kaxiras E, Pandey KC, Bar-Yam Y, Joannopoulos JD. Role of chemical potentials in surface reconstruction: A new model and phase transition of GaAs(111)2x2. PHYSICAL REVIEW LETTERS 1986; 56:2819-2822. [PMID: 10033103 DOI: 10.1103/physrevlett.56.2819] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Robinson IK, Waskiewicz WK, Fuoss PH, Stark JB, Bennett PA. X-ray diffraction evidence of adatoms in the Si(111)7 x 7 reconstructed surface. PHYSICAL REVIEW. B, CONDENSED MATTER 1986; 33:7013-7016. [PMID: 9938027 DOI: 10.1103/physrevb.33.7013] [Citation(s) in RCA: 66] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Kaxiras E, Bar-Yam Y, Joannopoulos JD, Pandey KC. (2 x 2) reconstructions of the {111} polar surfaces of GaAs. PHYSICAL REVIEW. B, CONDENSED MATTER 1986; 33:4406-4409. [PMID: 9938896 DOI: 10.1103/physrevb.33.4406] [Citation(s) in RCA: 25] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Robinson IK. Crystal truncation rods and surface roughness. PHYSICAL REVIEW. B, CONDENSED MATTER 1986; 33:3830-3836. [PMID: 9938797 DOI: 10.1103/physrevb.33.3830] [Citation(s) in RCA: 226] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Xu G, Hu WY, Puga MW, Tong SY, Yeh JL, Wang SR, Lee BW. Atomic geometry of the 2 x 2 GaP(111) surface. PHYSICAL REVIEW. B, CONDENSED MATTER 1985; 32:8473-8476. [PMID: 9937055 DOI: 10.1103/physrevb.32.8473] [Citation(s) in RCA: 29] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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