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For: Wu H, Lapeyre GJ, Huang H, Tong SY. New experimental technique for determining real-space atomic images applied to aluminum adsorbed on silicon (111). Phys Rev Lett 1993;71:251-254. [PMID: 10054902 DOI: 10.1103/physrevlett.71.251] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Number Cited by Other Article(s)
1
Wu H, Xu S, Ma S, Lau WP, Xie MH, Tong SY. Surface atomic arrangement visualization via reference-atom-specific holography. PHYSICAL REVIEW LETTERS 2002;89:216101. [PMID: 12443434 DOI: 10.1103/physrevlett.89.216101] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/06/2002] [Indexed: 05/24/2023]
2
Wider J, Baumberger F, Sambi M, Gotter R, Verdini A, Bruno F, Cvetko D, Morgante A, Greber T, Osterwalder J. Atomically resolved images from near node photoelectron holography experiments on Al(111). PHYSICAL REVIEW LETTERS 2001;86:2337-2340. [PMID: 11289923 DOI: 10.1103/physrevlett.86.2337] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/15/2000] [Indexed: 05/23/2023]
3
Xu SH, Keeffe M, Yang Y, Chen C, Yu M, Lapeyre GJ, Rotenberg E, Denlinger J, Yates JT. Photoelectron diffraction imaging for C2H2 and C2H4 chemisorbed on Si(100) reveals a new bonding configuration. PHYSICAL REVIEW LETTERS 2000;84:939-942. [PMID: 11017410 DOI: 10.1103/physrevlett.84.939] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/09/1999] [Revised: 10/01/1999] [Indexed: 05/23/2023]
4
Hong IH, Liao DK, Chou YC, Wei CM, Tong SY. Direct observation of ordered trimers on Si(111) sqrt 3 x sqrt 3 R30 degrees-Au by scanned-energy glancing-angle Kikuchi electron wave-front reconstruction. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;54:4762-4765. [PMID: 9986437 DOI: 10.1103/physrevb.54.4762] [Citation(s) in RCA: 27] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
5
Caputi LS, Comite O, Amoddeo A, Chiarello G, Scalese S, Colavita E, Papagno L. Surface Holography by Angle-Resolved Electron-Energy-Loss Spectroscopy. PHYSICAL REVIEW LETTERS 1996;77:1059-1062. [PMID: 10062980 DOI: 10.1103/physrevlett.77.1059] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
6
Gog T, Len PM, Materlik G, Bahr D, Fadley CS, Sanchez-Hanke C. Multiple-energy x-ray holography: Atomic images of hematite (Fe2O3). PHYSICAL REVIEW LETTERS 1996;76:3132-3135. [PMID: 10060883 DOI: 10.1103/physrevlett.76.3132] [Citation(s) in RCA: 25] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
7
Chemically Adsorbed Layers on Metal and Semiconductor Surfaces. ACTA ACUST UNITED AC 1996. [DOI: 10.1016/s1573-4331(96)80014-x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
8
Hong IH, Shyu SC, Chou YC, Wei CM. Surface-dimer and bulk-atom imaging of the Si(001) (2 x 1) surface by Kikuchi electron holography. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;52:16884-16891. [PMID: 9981096 DOI: 10.1103/physrevb.52.16884] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
9
Sieger MT, Miller T, Chiang T. Site-Dependent Fine Structure in Photoemission Branching Ratios. PHYSICAL REVIEW LETTERS 1995;75:2043-2046. [PMID: 10059194 DOI: 10.1103/physrevlett.75.2043] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
10
Saldin DK, Chen X. Three-dimensional reconstruction by holographic LEED: Proper identification of the reference wave. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;52:2941-2948. [PMID: 9981366 DOI: 10.1103/physrevb.52.2941] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
11
Wu H, Lapeyre GJ. Small-cone method of directly forming atomic images from energy-dependent photoelectron-diffraction data. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;51:14549-14553. [PMID: 9978387 DOI: 10.1103/physrevb.51.14549] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
12
Hanada T, Daimon H, Ino S. Rocking-curve analysis of reflection high-energy electron diffraction from the Si(111)-( sqrt 3 x sqrt 3 )R30 degrees-Al, -Ga, and -In surfaces. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;51:13320-13325. [PMID: 9978135 DOI: 10.1103/physrevb.51.13320] [Citation(s) in RCA: 35] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
13
Jeng PR, Hong IH, Chou YC, Wei CM. Direct atomic imaging of Ag(100) and Ag(111) by inverting quasielastically scattered electron-diffraction patterns. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;51:13645-13652. [PMID: 9978167 DOI: 10.1103/physrevb.51.13645] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
14
Tong SY, Li H, Huang H. Initial-state and scattering-factor effects in photoelectron holography. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;51:1850-1854. [PMID: 9978908 DOI: 10.1103/physrevb.51.1850] [Citation(s) in RCA: 20] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
15
Zharnikov M, Weinelt M, Zebisch P, Stichler M, Steinrück H. First Experimental Determination of an Adsorption Site Using Multiple Wave Number Photoelectron Diffraction Patterns. PHYSICAL REVIEW LETTERS 1994;73:3548-3551. [PMID: 10057411 DOI: 10.1103/physrevlett.73.3548] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
16
Chen X, Saldin DK. Nonlinear holographic crystallography. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;50:17463-17470. [PMID: 9976151 DOI: 10.1103/physrevb.50.17463] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
17
Sieger MT, Roesler JM, Lin D, Miller T, Chiang T. Holography of Ge(111)-c(2 x 8) by surface core-level photoemission. PHYSICAL REVIEW LETTERS 1994;73:3117-3120. [PMID: 10057292 DOI: 10.1103/physrevlett.73.3117] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
18
Wei C, Hong I, Jeng P, Shyu S, Chou Y. Electron-emission holography. A new direct method for surface structural determination. Chem Phys Lett 1994. [DOI: 10.1016/0009-2614(94)00980-5] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/27/2022]
19
Vattuone L, Rocca M. Influence of electron reflectivity on the analysis of surface processes: O2-Ag(110). PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:14744-14745. [PMID: 10010568 DOI: 10.1103/physrevb.49.14744] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
20
Direct identification of atomic and molecular adsorption sites using photoelectron diffraction. Nature 1994. [DOI: 10.1038/368131a0] [Citation(s) in RCA: 81] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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