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For: Krug C, da Rosa EB, de Almeida RM, Morais J, Baumvol IJ, Salgado TD, Stedile FC. Atomic transport and chemical stability during annealing of ultrathin Al2O3 films on Si. Phys Rev Lett 2000;85:4120-4123. [PMID: 11056639 DOI: 10.1103/physrevlett.85.4120] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2000] [Indexed: 05/23/2023]
Number Cited by Other Article(s)
1
Khayyat MM, Wacaser BA, Reuter MC, Ross FM, Sadana DK, Chen TC. Nanoscale chemical templating of Si nanowires seeded with Al. NANOTECHNOLOGY 2013;24:235301. [PMID: 23670339 DOI: 10.1088/0957-4484/24/23/235301] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
2
He G, Sun Z, Shi S, Chen X, Lv J, Zhang L. Metal-organic chemical vapor deposition of aluminium oxynitride from propylamine–dimethylaluminium hydride and oxygen: growth mode dependence and performance optimization. ACTA ACUST UNITED AC 2012. [DOI: 10.1039/c2jm16747f] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
3
Dutta S, Ramesh S, Shankar B, Gopalan S. Effect of PVD process parameters on the quality and reliability of thin (10–30 nm) Al2O3 dielectrics. APPLIED NANOSCIENCE 2011. [DOI: 10.1007/s13204-011-0033-0] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/01/2022]
4
Copel M. Comment on "atomic transport and chemical stability during annealing of ultrathin Al2O3 films on Si". PHYSICAL REVIEW LETTERS 2001;86:4713-4714. [PMID: 11384325 DOI: 10.1103/physrevlett.86.4713] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/09/2001] [Indexed: 05/23/2023]
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