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For: Meyer zu Heringdorf FJ, Schmidt T, Heun S, Hild R, Zahl P, Ressel B, Bauer E, Horn-von Hoegen M. Spatial variation of au coverage as the driving force for nanoscopic pattern formation. Phys Rev Lett 2001;86:5088-5091. [PMID: 11384428 DOI: 10.1103/physrevlett.86.5088] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/09/2000] [Indexed: 05/23/2023]
Number Cited by Other Article(s)
1
van Gastel R, Kaminski D, Vlieg E, Poelsema B. Phase transition driven discontinuity in thermodynamic size selection. PHYSICAL REVIEW LETTERS 2012;109:195501. [PMID: 23215397 DOI: 10.1103/physrevlett.109.195501] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/19/2012] [Indexed: 06/01/2023]
2
Selected-area diffraction and spectroscopy in LEEM and PEEM. Ultramicroscopy 2012;120:73-7. [DOI: 10.1016/j.ultramic.2012.06.003] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/01/2012] [Revised: 06/01/2012] [Accepted: 06/05/2012] [Indexed: 11/30/2022]
3
Klein C, Nabbefeld T, Hattab H, Meyer D, Jnawali G, Kammler M, Meyer zu Heringdorf FJ, Golla-Franz A, Müller BH, Schmidt T, Henzler M, Horn-von Hoegen M. Lost in reciprocal space? Determination of the scattering condition in spot profile analysis low-energy electron diffraction. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2011;82:035111. [PMID: 21456793 DOI: 10.1063/1.3554305] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
4
Altman MS. Trends in low energy electron microscopy. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2010;22:084017. [PMID: 21389393 DOI: 10.1088/0953-8984/22/8/084017] [Citation(s) in RCA: 29] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
5
Buckanie NM, Göhre J, Zhou P, von der Linde D, Horn-von Hoegen M, Meyer Zu Heringdorf FJ. Space charge effects in photoemission electron microscopy using amplified femtosecond laser pulses. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2009;21:314003. [PMID: 21828564 DOI: 10.1088/0953-8984/21/31/314003] [Citation(s) in RCA: 28] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
6
Wiethoff C, Ross FM, Copel M, Horn-von Hoegen M, Meyer Zu Heringdorf FJ. Au stabilization and coverage of sawtooth facets on Si nanowires grown by vapor-liquid-solid epitaxy. NANO LETTERS 2008;8:3065-3068. [PMID: 18710295 DOI: 10.1021/nl801146q] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/26/2023]
7
Thien D, Kury P, Horn-von Hoegen M, Meyer Zu Heringdorf FJ, van Heys J, Lindenblatt M, Pehlke E. Domain sensitive contrast in photoelectron emission microscopy. PHYSICAL REVIEW LETTERS 2007;99:196102. [PMID: 18233086 DOI: 10.1103/physrevlett.99.196102] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/19/2007] [Indexed: 05/25/2023]
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