Schmidt P, Berndt R, Vexler MI. Ultraviolet light emission from si in a scanning tunneling microscope.
PHYSICAL REVIEW LETTERS 2007;
99:246103. [PMID:
18233462 DOI:
10.1103/physrevlett.99.246103]
[Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/28/2007] [Indexed: 05/25/2023]
Abstract
Ultraviolet and visible radiation is observed from the contacts of a scanning tunneling microscope with Si(100) and (111) wafers. This luminescence relies on the presence of hot electrons in silicon, which are supplied, at positive bias on n- and p-type samples, through the injection from the tip, or, at negative bias on p samples, by Zener tunneling. Measured spectra reveal a contribution of direct optical transitions in Si bulk. The necessary holes well below the valence band edge are injected from the tip or generated by Auger processes.
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