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For: Bataille AM, Auvray V, Gatel C, Gukasov A. Contrast enhancement of data measured with area detectors: a way to generalize the use of neutron diffraction for thin-film studies. J Appl Crystallogr 2013. [DOI: 10.1107/s002188981300890x] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open

For:	Bataille AM, Auvray V, Gatel C, Gukasov A. Contrast enhancement of data measured with area detectors: a way to generalize the use of neutron diffraction for thin-film studies. J Appl Crystallogr 2013. [DOI: 10.1107/s002188981300890x] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open

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