Chamard V, Holý V. Introduction to the special issue on high-resolution X-ray diffraction and imaging.
J Appl Crystallogr 2017;
50:671-672. [PMID:
28656031 PMCID:
PMC5458585 DOI:
10.1107/s1600576717007257]
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Abstract
The latest virtual special issue of Journal of Applied Crystallography features some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), held in Brno, Czech Republic, in September 2016.
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