Rietveld in 100 picoseconds

Electronic angle focusing for neutron time-of-flight powder diffractometers

A neutron time-of-flight (TOF) powder diffractometer with a continuous wide-angle array of detectors can be electronically focused to make a single pseudo-constant wavelength diffraction pattern, thus facilitating angle-dependent intensity corrections. The resulting powder diffraction peak profiles are affected by the neutron source emission profile and resemble the function currently used for TOF diffraction.

Rietveld in 100 picoseconds

A recent article by Von Dreele, Clarke & Walsh [J. Appl. Cryst. (2021), 54, https://doi.org/10.1107/S1600576720014624] introduces an entirely new paradigm in structure determination, where a complete structural measurement is made in a tenth of a nanosecond.