A real-time phase-space beam emittance monitoring system

Exploring beam size measurement based on the Talbot effect at BEPCII

Vertical beam size measurements were carried out at Beijing Electron-Positron Collider II (BEPCII) using a phase grating and an absorption grating based on the Talbot effect. The transverse coherence of synchrotron radiation is closely related to beam size. Due to the partial coherence of the synchrotron radiation source, the coherence length can be calculated by measuring the visibility decay of interferograms recorded at different distances behind the gratings. A vertical beam size of 68.19 ± 2 µm was obtained based on the relationship between the coherence length and beam size at the 3W1 beamline of BEPCII. A comparison of the vertical emittance derived from the grating Talbot method and the synchrotron radiation visible light interferometer method was presented. The vertical emittances from the two methods are 1.41 nm rad and 1.40 nm rad, respectively. The 0.1% difference indicates that the grating Talbot method for beam size measurement is reliable. This technique has great potential for small beam size measurement of fourth-generation synchrotron radiation light sources, considering its small diffraction limitation and simple experimental setups.

Synchrotron radiation stability with meV-level energy resolution: in situ characterization

One of the most critical parameters in synchrotron radiation (SR) experiments is the stability of the photon energy, which is primarily affected by the stability of the light source and the optical elements in the beamline. Due to the characteristics of SR and the use of dispersive elements such as monochromators in the beamline, the change of the beam position is usually accompanied by the change of energy and flux, while most traditional beam monitoring methods are based on the direct or indirect measurement of total flux, and are therefore sensitive to the beam position only, having no energy resolution. In this paper, an in situ monitoring system has been designed to measure the short-term (jitter) and long-term (drift) characteristics of the energy variation in the SR beamline. The system consists of a double-crystal monochromator, an orthogonal analysis crystal, and an X-ray imaging detector, which could decouple the angle and energy spread of the photon beam based on the dispersion effect in Bragg diffraction. The time response and the energy resolution of the system could reach millisecond and millielectron volt level, respectively.

A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources

The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-crystal diffraction geometry, including a crystal-based monochromator and a Laue crystal in a dispersive setting to the monochromator. By measuring the flat beam and the transmitted beam profiles, the system can provide a simultaneous high-sensitivity characterization of the source size, divergence, position, and angle in the diffraction plane of the multi-crystal system. Detailed theoretical modeling predicts the system's feasibility as a versatile characterization tool for monitoring the X-ray source and beam properties. The experimental validation was conducted at a bending magnet beamline at the Swiss Light Source by varying the machine parameters. A measurement sensitivity of less than 10% of a source size of around 12 µm is demonstrated. The proposed system offers a compact setup with simple X-ray optics and can also be utilized for monitoring the electron source.

X-ray beam monitoring and wavelength calibration using four-beam diffraction

Rigorous dynamical theory calculations show that four-beam diffraction (4BD) can be activated only by a unique photon energy and a unique incidence direction. Thus, 4BD may be used to precisely calibrate X-ray photon energies and beam positions. Based on the principles that the forbidden-reflection 4BD pattern, which is typically an X-shaped cross, can be generated by instant imaging using the divergent beam from a point source without rocking the crystal, a detailed real-time high-resolution beam (and source) position monitoring scheme is illustrated for monitoring two-dimensional beam positions and directions of modern synchrotron light sources, X-ray free-electron lasers and nano-focused X-ray sources.

Optimization of a phase-space beam position and size monitor for low-emittance light sources

The recently developed vertical phase-space beam position and size monitor (ps-BPM) system has proven to be able to measure the electron-source position, angle, size and divergence simultaneously in the vertical plane at a single location of a beamline. The optimization of the ps-BPM system is performed by ray-tracing simulation to maximize the instrument sensitivity and resolution. The contribution of each element is studied, including the monochromator, the K-edge filter, the detector and the source-to-detector distance. An optimized system is proposed for diffraction-limited storage rings, such as the Advanced Photon Source Upgrade project. The simulation results show that the ps-BPM system can precisely monitor the source position and angle at high speed. Precise measurements of the source size and divergence will require adequate resolution with relatively longer integration time.