Jitter correction for transmission X-ray microscopy via measurement of geometric moments

Drift Artifacts Correction for Laboratory Cone-Beam Nanoscale X-ray Computed Tomography by Fitting the Partial Trajectory of Projection Centroid

A self-correction method for the drift artifacts of laboratory cone-beam nanoscale X-ray computed tomography (nano-CT) based on the trajectory of projection centroid (TPC) is proposed. This method does not require additional correction phantoms, simplifying the correction process. The whole TPC is estimated by the partial TPC in the optimal projection set. The projection drift is calculated by the measured TPC and the estimated TPC. The interval search method is used so that the proposed method can adapt to the case of a truncated projection due to drift. The fixed-angle scanning experiment of the Siemens star and the partial derivative analysis of the projection position show the necessity of correcting drift artifacts. Further, the Shepp–Logan phantoms with different drift levels are simulated. The results show that the proposed method can effectively estimate the horizontal and vertical drifts within the projection drift range of ±2 mm (27 pixels) with high accuracy. Experiments were conducted on tomato seed and bamboo stick to validate the feasibility of the proposed method for samples with different textures. The correction effect on different reconstructed slices indicates that the proposed method provides performance superior to the reference scanning method (RSM) and global fitting. In addition, the proposed method requires no extra scanning, which improves the acquisition efficiency, as well as radiation utilization.

Limited angle tomography for transmission X-ray microscopy using deep learning

In transmission X-ray microscopy (TXM) systems, the rotation of a scanned sample might be restricted to a limited angular range to avoid collision with other system parts or high attenuation at certain tilting angles. Image reconstruction from such limited angle data suffers from artifacts because of missing data. In this work, deep learning is applied to limited angle reconstruction in TXMs for the first time. With the challenge to obtain sufficient real data for training, training a deep neural network from synthetic data is investigated. In particular, U-Net, the state-of-the-art neural network in biomedical imaging, is trained from synthetic ellipsoid data and multi-category data to reduce artifacts in filtered back-projection (FBP) reconstruction images. The proposed method is evaluated on synthetic data and real scanned chlorella data in 100° limited angle tomography. For synthetic test data, U-Net significantly reduces the root-mean-square error (RMSE) from 2.55 × 10-3 µm-1 in the FBP reconstruction to 1.21 × 10-3 µm-1 in the U-Net reconstruction and also improves the structural similarity (SSIM) index from 0.625 to 0.920. With penalized weighted least-square denoising of measured projections, the RMSE and SSIM are further improved to 1.16 × 10-3 µm-1 and 0.932, respectively. For real test data, the proposed method remarkably improves the 3D visualization of the subcellular structures in the chlorella cell, which indicates its important value for nanoscale imaging in biology, nanoscience and materials science.