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Modi MH, Gupta R, Gupta S, Yadav PK, Kant C, Lal S, Raghuvanshi VK, Kane SR. A versatile beamline for soft x-ray reflectivity, absorption, and fluorescence measurements at Indus-2 synchrotron source. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2024; 95:023904. [PMID: 38364036 DOI: 10.1063/5.0190169] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/04/2023] [Accepted: 01/25/2024] [Indexed: 02/18/2024]
Abstract
A versatile beamline for performing reflectivity, fluorescence, and absorption experiments in the soft x-ray region of 100-1500 eV is commissioned on a bending magnet port of the Indus-2 synchrotron source. A high vacuum 2-axis reflectometer with x, y, and z sample scanning stages is installed. This reflectometer is used to measure the reflectivity of large samples up to 300 mm in length and 5 kg in weight. This feature is useful for characterizing x-ray optical elements, such as mirrors, gratings, and multilayers. A flange mounted silicon drift detector is installed in the downstream of the reflectometer for soft x-ray fluorescence measurements. The soft x-ray absorption measurements are carried out in the total electron yield and partial fluorescence yield modes. Integration of three different experimental techniques in the experimental station makes the beamline versatile for materials science applications as it provides structural, chemical, and electronic state information by performing the required experiments in an identical environment. The beamline uses a varied line spacing plane grating monochromator and gives a high flux (∼109 to 1011 photon/s) with a moderate resolution (λ/Δλ ~1000-5000). A three-mirror-based higher harmonic setup is incorporated to get rid of harmonics and to get a high spectral purity monochromatic beam with less than 0.1% harmonic content. In the present article, the beamline optical scheme, mechanical configuration, and details of the experimental setups are presented, along with a few representative results of each experimental mode.
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Affiliation(s)
- Mohammed H Modi
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
- Homi Bhabha National Institute, Anushakti Nagar, Mumbai 400094, India
| | - Rajkumar Gupta
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
| | - Shruti Gupta
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
| | - Praveen Kumar Yadav
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
| | - Chander Kant
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
| | - Sohan Lal
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
| | - V K Raghuvanshi
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
| | - S R Kane
- Accelerator Physics and Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India
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Sarkar P, Biswas A, Kumar R, Rai S, Jha SN, Bhattacharyya D. Role of C and B 4C barrier layers in controlling diffusion propagation across the interface of Cr/Sc multilayers. Phys Chem Chem Phys 2023; 25:3072-3082. [PMID: 36620902 DOI: 10.1039/d2cp03785h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/10/2023]
Abstract
The optical performance of low-bilayer-thickness metallic multilayers (ML) can be improved significantly by limiting the intermixing of consecutive layers at the interfaces. Barrier layers are supposed to exhibit a decisive role in controlling diffusion across the interfaces. The element-specific grazing incidence extended X-ray absorption fine structure technique using synchrotron radiation has been used in conjunction with grazing incidence X-ray reflectivity and diffuse X-ray scattering measurements to study the impact of the two most common barrier layers, viz., C and B4C, at the interfaces of Cr/Sc MLs. The diffusion propagation is reduced by both the barrier layers; however, it is found that the improvement is more significant with the B4C barrier layer. It is seen that C forms an intermixed layer with Sc and leads to carbide formation at the interface, which then acts as shielding and prevents further interdiffusion, while B4C hardly penetrates into Sc and stops the overlap between Sc and Cr directly by wetting the corresponding interface. Thus, the above measurements reveal crucial and precise information regarding the elemental diffusion kinetics at the interfaces of Cr/Sc MLs in a non-destructive way, which is very important for technological applications of these MLs as X-ray optical devices.
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Affiliation(s)
- P Sarkar
- Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085, India.
| | - A Biswas
- Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085, India.
| | - Ravi Kumar
- Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085, India.
| | - S Rai
- Synchrotron Utilisation Section, Raja Ramnna Centre for Advanced Technology, Indore 752013, India
| | - S N Jha
- Beamline Development & Applications Section Bhabha Atomic Research Centre, Mumbai 400 085, India
| | - D Bhattacharyya
- Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400 085, India.
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