1
|
Li T, Dresselhaus JL, Ivanov N, Prasciolu M, Fleckenstein H, Yefanov O, Zhang W, Pennicard D, Dippel AC, Gutowski O, Villanueva-Perez P, Chapman HN, Bajt S. Dose-efficient scanning Compton X-ray microscopy. LIGHT, SCIENCE & APPLICATIONS 2023; 12:130. [PMID: 37248250 DOI: 10.1038/s41377-023-01176-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Subscribe] [Scholar Register] [Received: 03/02/2023] [Revised: 04/28/2023] [Accepted: 05/05/2023] [Indexed: 05/31/2023]
Abstract
The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure, induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried, unstained, and unfixed biological objects obtained by scanning Compton X-ray microscopy, at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision, a new wavefront measurement scheme for hard X rays, and efficient pixel-array detectors. The doses required to form these images were as little as 0.02% of the tolerable dose and 0.05% of that needed for phase-contrast imaging at similar resolution using 17 keV photon energy. The images obtained provide a quantitative map of the projected mass density in the sample, as confirmed by imaging a silicon wedge. Based on these results, we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.
Collapse
Affiliation(s)
- Tang Li
- The Hamburg Centre for Ultrafast Imaging, 22761, Hamburg, Germany
| | | | - Nikolay Ivanov
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Mauro Prasciolu
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Holger Fleckenstein
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Oleksandr Yefanov
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Wenhui Zhang
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - David Pennicard
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | | | - Olof Gutowski
- Deutsches Elektronen Synchrotron DESY, 22607, Hamburg, Germany
| | | | - Henry N Chapman
- The Hamburg Centre for Ultrafast Imaging, 22761, Hamburg, Germany.
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany.
- Department of Physics, Universität Hamburg, 22761, Hamburg, Germany.
| | - Saša Bajt
- The Hamburg Centre for Ultrafast Imaging, 22761, Hamburg, Germany.
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany.
| |
Collapse
|