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For: Ishikawa I, Kanda H, Katakura K, Semba T. Measurement of a damaged layer thickness with reflection acoustic microscope. IEEE Trans Ultrason Ferroelectr Freq Control 1989;36:587-592. [PMID: 18290238 DOI: 10.1109/58.39108] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Number Cited by Other Article(s)
1
Kundu T, Jørgensen CS. Measuring elastic properties of bones and silicon from V(z) curve generated by multiply reflected signals. ULTRASONICS 2002;39:515-524. [PMID: 12102395 DOI: 10.1016/s0041-624x(02)00247-0] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
2
Lavrentyev AI, Rokhlin SI. An ultrasonic method for determination of elastic moduli, density, attenuation and thickness of a polymer coating on a stiff plate. ULTRASONICS 2001;39:211-221. [PMID: 11350002 DOI: 10.1016/s0041-624x(00)00066-4] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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