Representative volume elements of strain/stress fields measured by diffraction techniques

Finite-element modelling has been used to simulate local strains and stresses within free-standing polycrystalline slabs of W, Cu and W-Cu, heated with free or constrained boundaries. The elastic strain values in crystallites that satisfied the diffraction condition were used to simulate the lattice strain data that would be obtained from diffraction analysis, from which the average stresses within diffracting domains were computed. Comparison of direct-space stresses in the model with the average stresses determined from diffraction analysis shows that the representative volume elements (RVEs) required to obtain equivalent stress/strain values depend on the deformation mode suffered by the material. Further, the direct-space and diffraction stress values agree only under strict sampling and strain/stress uniformity conditions. Consequently, in samples where measurements are conducted in volumes smaller than the RVE, or where the uniformity conditions are not satisfied, further experimental and numerical techniques might be needed for the accurate determination of applied or residual stress distributions.

Experimental determination of precision, resolution, accuracy and trueness of time-of-flight neutron diffraction strain measurements

A simple statistical analysis which yields the precision, resolution, accuracy and trueness of diffraction-based lattice strain measurements is discussed. The procedure consists of measuring the thermal expansion induced in each component of an ideal non-reacting two-component crystalline powder sample in situ. One component, with a high coefficient of thermal expansion (CTE), serves as an internal thermometer. The quantities of interest are obtained by determining the smallest statistically significant thermal lattice strain which can be detected through diffraction analysis in the second, low-CTE, component in response to controlled temperature changes. This procedure also provides a robust check of the alignment of the diffraction system and is able to reveal the presence of systematic errors. The application of this technique to a time-of-flight engineering diffractometer/strain scanner is presented.