EEG Artifact Removal by Bayesian Deep Learning & ICA

Detection of Unfocused EEG Epochs by the Application of Machine Learning Algorithm

Electroencephalography (EEG) is a non-invasive method used to track human brain activity over time. The time-locked EEG to an external event is known as event-related potential (ERP). ERP can be a biomarker of human perception and other cognitive processes. The success of ERP research depends on the laboratory conditions and attentiveness of the test subjects. Specifically, the inability to control experimental variables has reduced ERP research in the real world. This study collected EEG data under various experimental circumstances within an auditory oddball paradigm experiment to enable the use of ERP as an active biomarker in normal laboratory conditions. Then, ERP epochs were analyzed to identify unfocused epochs, affected by typical artifacts and external distortion. For the initial comparison, the ability of four unsupervised machine learning algorithms (MLAs) was evaluated to identify unfocused epochs. Then, their accuracy was compared with the human inspection and a current EEG analysis tool (EEGLab). All four MLAs were typically 95-100% accurate. In summary, our analysis finds that humans might miss subtle differences in the regular ERP patterns, but MLAs could efficiently identify those. Thus, our analysis suggests that unsupervised MLAs perform better for detecting unfocused ERP epochs compared with the other two standard methods.

A complex-valued slow independent component analysis based incipient fault detection and diagnosis method with applications to wastewater treatment processes

Multivariate statistical process monitoring are the essential approaches to achieve better prognostics and health management (PHM) of process industries. However, incipient faults and complex behaviors (such as nonlinearity and dynamics) always render the traditional multivariate statistical process monitoring approaches inadequate. Thus, a complex-valued slow independent component analysis (CSICA) is proposed, which is able to extract optimized features from a complex-valued matrix containing both of raw data and their changing rates by resorting to a complex-valued independent component analysis operation and a batch of phase shifts. These features, named slow independent components (SICs), not only guarantee the statistical independence but also capture slowly-changing patterns, thus refining both dynamic and non-Gaussian information mostly related with incipient faults. The proposed algorithm together with novel statistics, I_s², I_f² and SPE, as well as their control limits can sequentially detect incipient faults effectively. Then, together with the novel differential mapping reconstructed contribution plot (DM-RCP) and Granger causality analysis, the proposed method can accurately locate rooting causes of incipient faults. Finally, the proposed framework of process monitoring is validated through two data sets from a simulation platform and an oxidation-ditch-based wastewater treatment plant, respectively. The results demonstrate that the proposed method can achieve more accurate and efficient performances than conventional methods.

Real-time noise cancellation with deep learning

Biological measurements are often contaminated with large amounts of non-stationary noise which require effective noise reduction techniques. We present a new real-time deep learning algorithm which produces adaptively a signal opposing the noise so that destructive interference occurs. As a proof of concept, we demonstrate the algorithm's performance by reducing electromyogram noise in electroencephalograms with the usage of a custom, flexible, 3D-printed, compound electrode. With this setup, an average of 4dB and a maximum of 10dB improvement of the signal-to-noise ratio of the EEG was achieved by removing wide band muscle noise. This concept has the potential to not only adaptively improve the signal-to-noise ratio of EEG but can be applied to a wide range of biological, industrial and consumer applications such as industrial sensing or noise cancelling headphones.

EPIC: Annotated epileptic EEG independent components for artifact reduction

Scalp electroencephalogram is a non-invasive multi-channel biosignal that records the brain’s electrical activity. It is highly susceptible to noise that might overshadow important data. Independent component analysis is one of the most used artifact removal methods. Independent component analysis separates data into different components, although it can not automatically reject the noisy ones. Therefore, experts are needed to decide which components must be removed before reconstructing the data. To automate this method, researchers have developed classifiers to identify noisy components. However, to build these classifiers, they need annotated data. Manually classifying independent components is a time-consuming task. Furthermore, few labelled data are publicly available. This paper presents a source of annotated electroencephalogram independent components acquired from patients with epilepsy (EPIC Dataset). This dataset contains 77,426 independent components obtained from approximately 613 hours of electroencephalogram, visually inspected by two experts, which was already successfully utilised to develop independent component classifiers.

Measurement(s)	Electroencephalogram Independent Components
Technology Type(s)	MATLAB and Python

Ensemble Deep Neural Network for Automatic Classification of EEG Independent Components

OBJECTIVE

Independent component analysis (ICA) is commonly used to remove noisy artifacts from multi-channel scalp electroencephalogram (EEG) signals. ICA decomposes EEG into different independent components (ICs) and then, experts remove the noisy ones. This process is highly time-consuming and experts are not always available. To surpass this drawback, research is going on to develop models to automatically conduct IC classification. Current state-of-the-art models use power spectrum densities (PSDs) and topoplots to classify ICs. The performance of these methods may be limited by disregarding the IC time-series that would contribute to fully simulate the visual inspection performed by experts.

METHODS

We present a novel ensemble deep neural network that combines time-series, PSDs, and topoplots to classify ICs. Moreover, we study the ability to use our model in transfer learning approaches.

RESULTS

Experimental results showed that using time-series improves IC classification. Results also indicated that transfer learning obtained higher performance than simply training a new model from scratch.

CONCLUSION

Researchers should develop IC classifiers using the three sources of information. Moreover, transfer learning approaches should be considered when producing new deep learning models.

SIGNIFICANCE

This work improves IC classification, enhancing the automatic removal of EEG artifacts. Additionally, since labelled ICs are generally not publicly available, the possibility of using our model in transfer learning studies may motivate other researchers to develop their own classifiers.