An efficient forward solver in electrical impedance tomography by spectral element method

Non-Destructive Testing Using Eddy Current Sensors for Defect Detection in Additively Manufactured Titanium and Stainless-Steel Parts

In this study, different eddy-current based probe designs (absolute and commercial reflection) are used to detect artificial defects with different sizes and at different depths in parts composed of stainless-steel (316) and titanium (TI-64) made by Laser Additive Manufacturing (LAM). The measured defect signal value using the probes is in the range of (20-200) millivolts. Both probes can detect subsurface defects on stainless-steel samples with average surface roughness of 11.6 µm and titanium samples with average surface roughness of 8.7 µm. It is found the signal reading can be improved by adding a coating layer made of thin paper to the bottom of the probes. The layer will decrease the surface roughness effect and smooth out the detected defect signal from any ripples. The smallest subsurface artificial defect size detected by both probes is an artificially made notch with 0.07 mm width and 25 mm length. In addition, both probes detected subsurface artificial blind holes in the range of 0.17 mm-0.3 mm radius. Results show that the absolute probe is more suitable to detect cracks and incomplete fusion holes, whereas the reflection probe is more suitable to detect small diameter blind holes. The setup can be used for defect detection during the additive manufacturing process once the melt pool is solidified.

An image reconstruction algorithm for 3-D electrical impedance mammography

The Sussex MK4 electrical impedance mammography system is especially designed for 3-D breast screening. It aims to diagnose breast cancer at an early stage when it is most treatable. Planar electrodes are employed in this system. The challenge with planar electrodes is the inaccuracy and poor sensitivity in the vertical direction for 3-D imaging. An enhanced image reconstruction algorithm using a duo-mesh method is proposed to improve the vertical accuracy and sensitivity. The novel part of the enhanced image reconstruction algorithm is the correction term. To evaluate the new algorithm, an image processing based error analysis method is presented, which not only can precisely assess the error of the reconstructed image but also locate the center and outline the center and outline the shape of the objects of interest. Although the enhanced image reconstruction algorithm and the image processing based error analysis method are designed for the Sussex MK4 system, they are applicable to all electrical impedance tomography systems, regardless of the hardware design. To validate the enhanced algorithm, performance results from simulations, phantoms and patients are presented.