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Citation(s) in RCA

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Results Analysis
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Number Cited by Other Article(s)
1
EDX spectrum modelling and multivariate analysis of sub-nanometer segregation. Micron 1999. [DOI: 10.1016/s0968-4328(99)00020-7] [Citation(s) in RCA: 22] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]
2
Sung CM, Williams DB. Principle and applications of convergent beam electron diffraction: a bibliography (1938-1990). JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE 1991;17:95-118. [PMID: 1993941 DOI: 10.1002/jemt.1060170110] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/29/2022]
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