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For: MAHALINGAM K, EYINK K, BROWN G, DORSEY D, KISIELOWSKI C, THUST A. Compositional analysis of mixed–cation-anion III–V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopy. J Microsc 2008;230:372-81. [DOI: 10.1111/j.1365-2818.2008.01995.x] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Number Cited by Other Article(s)
1
Brzeski J, Freza S, Czapla M, Skurski P. An Excess Electron Bound to Magnesium Halides and Basic Grignard Compounds (RMgX and RMgR, R = Me, Et, Ph; X = F, Cl, Br). J Phys Chem A 2021;125:2334-2343. [PMID: 33689341 PMCID: PMC8041300 DOI: 10.1021/acs.jpca.1c00750] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
2
Mahalingam K, Haugan HJ, Brown GJ, Eyink KG. Quantitative analysis of interfacial strain in InAs/GaSb superlattices by aberration-corrected HRTEM and HAADF-STEM. Ultramicroscopy 2013;127:70-5. [DOI: 10.1016/j.ultramic.2012.09.005] [Citation(s) in RCA: 23] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
3
Point defect characterization in HAADF-STEM images using multivariate statistical analysis. Ultramicroscopy 2011;111:251-7. [PMID: 21333863 DOI: 10.1016/j.ultramic.2010.11.033] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/10/2010] [Revised: 11/05/2010] [Accepted: 11/23/2010] [Indexed: 11/23/2022]
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