Gao L, Kester RT, Hagen N, Tkaczyk TS. Snapshot Image Mapping Spectrometer (IMS) with high sampling density for hyperspectral microscopy.
OPTICS EXPRESS 2010;
18:14330-44. [PMID:
20639917 PMCID:
PMC2909105 DOI:
10.1364/oe.18.014330]
[Citation(s) in RCA: 93] [Impact Index Per Article: 6.6] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/06/2010] [Revised: 06/14/2010] [Accepted: 06/14/2010] [Indexed: 05/20/2023]
Abstract
A snapshot Image Mapping Spectrometer (IMS) with high sampling density is developed for hyperspectral microscopy, measuring a datacube of dimensions 285 x 285 x 60 (x, y, lambda). The spatial resolution is approximately 0.45 microm with a FOV of 100 x 100 microm(2). The measured spectrum is from 450 nm to 650 nm and is sampled by 60 spectral channels with average sampling interval approximately 3.3 nm. The channel's spectral resolution is approximately 8nm. The spectral imaging results demonstrate the potential of the IMS for real-time cellular fluorescence imaging.
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