Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methods

Three-Dimensional Morphology and Analysis of Widmanstätten Sideplates Ferrite

The three-dimensional (3D) morphology and crystal structure of Widmanstätten sideplate ferrite were simulated using a focused ion beam (FIB) scanning electron microscope equipped with electron backscatter diffraction (EBSD). The primary Widmanstätten sideplates nucleated and grew directly at the austenite grain boundary (GB). A certain included angle between the sideplates and the austenite GB was observed. The sideplates grew approximately parallel to the grain, and were separated by a small-angle GB. The primary Widmanstätten sideplates are best described as “∃” shaped, with a long intermediate ferrite strip. The interface with the austenite GB was smooth and flat, and the sideplate surface contained pits and holes. The secondary Widmanstätten sideplates nucleated and grew on the surface of the proeutectoid GB ferrite, with the sideplates and GB ferrite perpendicular to each other. Sideplates parallel to one another grew into the grain, and were separated by small-angle GB. The 3D morphology was distinguished by its “comb” shape. The sideplates’ tail was clustered and its front end remained sharp. The contact side of the GB ferrite was smooth and flat. The surface contained several uneven pits and defects.