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For: Smalc-Koziorowska J, Moneta J, Muzioł G, Chromiński W, Kernke R, Albrecht M, Schulz T, Belabbas I. The dissociation of (a+c) misfit dislocations at the InGaN/GaN interface. J Microsc 2024;293:146-152. [PMID: 37846455 DOI: 10.1111/jmi.13234] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/09/2023] [Revised: 09/29/2023] [Accepted: 10/03/2023] [Indexed: 10/18/2023]
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Walther T, Oliver RA. Preface to the special issue on Microscopy of Semiconducting Materials 2023. J Microsc 2024;293:135-137. [PMID: 38282251 DOI: 10.1111/jmi.13265] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/30/2024]
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