• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4604544)   Today's Articles (4421)   Subscriber (49371)
For:  [Subscribe] [Scholar Register]
Number Cited by Other Article(s)
1
Comparison of Erosion Behavior and Particle Contamination in Mass-Production CF₄/O₂ Plasma Chambers Using Y₂O₃ and YF₃ Protective Coatings. NANOMATERIALS 2017;7:nano7070183. [PMID: 28708079 PMCID: PMC5535249 DOI: 10.3390/nano7070183] [Citation(s) in RCA: 35] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/15/2017] [Revised: 07/06/2017] [Accepted: 07/11/2017] [Indexed: 11/16/2022]
2
Liu K, Yu L, Bian W. Extensive theoretical study on various low-lying electronic states of silicon monochloride cation including spin-orbit coupling. J Phys Chem A 2010;113:1678-85. [PMID: 19203196 DOI: 10.1021/jp809618y] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
3
Real time scatterometry for profile control during resist trimming process. ACTA ACUST UNITED AC 2009. [DOI: 10.1116/1.3256594] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
4
Surface roughness generated by plasma etching processes of silicon. ACTA ACUST UNITED AC 2008. [DOI: 10.1116/1.2932091] [Citation(s) in RCA: 45] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
5
Poly-Si∕TiN∕HfO[sub 2] gate stack etching in high-density plasmas. ACTA ACUST UNITED AC 2007. [DOI: 10.1116/1.2732736] [Citation(s) in RCA: 43] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
6
Kurunczi PF, Guha J, Donnelly VM. Plasma-surface reactions at a spinning wall. PHYSICAL REVIEW LETTERS 2006;96:018306. [PMID: 16486531 DOI: 10.1103/physrevlett.96.018306] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/18/2005] [Indexed: 05/06/2023]
7
Etching characteristics of TiN used as hard mask in dielectric etch process. ACTA ACUST UNITED AC 2006. [DOI: 10.1116/1.2338048] [Citation(s) in RCA: 36] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
8
Kurunczi PF, Guha J, Donnelly VM. Recombination Reactions of Oxygen Atoms on an Anodized Aluminum Plasma Reactor Wall, Studied by a Spinning Wall Method. J Phys Chem B 2005;109:20989-98. [PMID: 16853721 DOI: 10.1021/jp054190h] [Citation(s) in RCA: 32] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/16/2022]
9
Mass spectrometry studies of resist trimming processes in HBr∕O[sub 2] and Cl[sub 2]∕O[sub 2] chemistries. ACTA ACUST UNITED AC 2005. [DOI: 10.1116/1.1839915] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
10
Chemical topography analyses of silicon gates etched in HBr/Cl[sub 2]/O[sub 2] and HBr/Cl[sub 2]/O[sub 2]/CF[sub 4] high density plasmas. ACTA ACUST UNITED AC 2003. [DOI: 10.1116/1.1563255] [Citation(s) in RCA: 24] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
11
Impact of chemistry on profile control of resist masked silicon gates etched in high density halogen-based plasmas. ACTA ACUST UNITED AC 2003. [DOI: 10.1116/1.1612932] [Citation(s) in RCA: 46] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA