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Non-classical applications of chemical analysis based on nuclear activation. J Radioanal Nucl Chem 2019. [DOI: 10.1007/s10967-019-06977-w] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]

Nuclear analysis at NBS and NIST. J Radioanal Nucl Chem 2018. [DOI: 10.1007/s10967-018-6192-7] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]

Meisenkothen F, Steel EB, Prosa TJ, Henry KT, Prakash Kolli R. Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomography. Ultramicroscopy 2015;159 Pt 1:101-11. [DOI: 10.1016/j.ultramic.2015.07.009] [Citation(s) in RCA: 51] [Impact Index Per Article: 5.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/24/2015] [Revised: 07/07/2015] [Accepted: 07/26/2015] [Indexed: 10/23/2022]

Colaux JL, Jeynes C, Heasman KC, Gwilliam RM. Certified ion implantation fluence by high accuracy RBS. Analyst 2015;140:3251-61. [DOI: 10.1039/c4an02316a] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]

Prosa T, Olson D, Geiser B, Larson D, Henry K, Steel E. Analysis of implanted silicon dopant profiles. Ultramicroscopy 2013;132:179-85. [DOI: 10.1016/j.ultramic.2012.10.005] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/12/2012] [Revised: 09/28/2012] [Accepted: 10/20/2012] [Indexed: 10/27/2022]

Lindstrom RM. Errors, PGAA, and metrology. J Radioanal Nucl Chem 2009. [DOI: 10.1007/s10967-009-0174-8] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]