Back to the basics of time-of-flight secondary ion mass spectrometry data analysis of bio-related samples. II. Data processing and display

Self-Assembled Monolayers of a Fluorinated Phosphonic Acid as a Protective Coating on Aluminum

Aluminum (Al) placed in hot water (HW) at 90 °C is roughened due to its reaction with water, forming Al hydroxide and Al oxide, as well as releasing hydrogen gas. The roughened surface is thus hydrophilic and possesses a hugely increased surface area, which can be useful in applications requiring hydrophilicity and increased surface area, such as atmospheric moisture harvesting. On the other hand, when using HW to roughen specified areas of an Al substrate, ways to protect the other areas from HW attacks are necessary. We demonstrated that self-assembled monolayers (SAMs) of a fluorinated phosphonic acid (FPA, CF3(CF2)13(CH2)2P(=O)(OH)2) derivatized on the native oxide of an Al film protected the underneath metal substrate from HW attack. The intact wettability and surface morphology of FPA-derivatized Al subjected to HW treatment were examined using contact angle measurement, and scanning electron microscopy and atomic force microscopy, respectively. Moreover, the surface and interface chemistry of FPA-derivatized Al before and after HW treatment were investigated by time-of-flight secondary ion mass spectrometry (ToF-SIMS), verifying that the FPA SAMs were intact upon HW treatment. The ToF-SIMS results therefore explained, on the molecular level, why HW treatment did not affect the underneath Al at all. FPA derivatization is thus expected to be developed as a patterning method for the formation of hydrophilic and hydrophobic areas on Al when combined with HW treatment.

Cell and tissue imaging by secondary ion mass spectrometry

This Tutorial focuses on the use of secondary ion mass spectrometry for the analysis of cellular and tissue samples. The Tutorial aims to cover the considerations in sample preparation analytical set up and some specific aspects of data interpretation associated with such analysis.

Assessing dead time effects when attempting isotope ratio quantification by time-of-flight secondary ion mass spectrometry

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a quasi-non-destructive technique capable of analyzing the outer monolayers of a solid sample and detecting all elements of the periodic table and their isotopes. Its ability to analyze the outer monolayers resides in sputtering the sample surface with a low-dose primary ion gun, which, in turn, imposes the use of a detector capable of counting a single ion at a time. Consequently, the detector saturates when more than one ion arrives at the same time hindering the use of TOF-SIMS for quantification purposes such as isotope ratio estimation. Even though a simple Poisson-based correction is usually implemented in TOF-SIMS acquisition software to compensate the detector saturation effects, this correction is only valid up to a certain extent and can be unnoticed by the inexperienced user. This tutorial describes a methodology based on different practices reported in the literature for dealing with the detector saturation effects and assessing the validity limits of Poisson-based correction when attempting to use TOF-SIMS data for quantification purposes. As a practical example, a dried lithium hydroxide solution was analyzed by TOF-SIMS with the aim of estimating the 6Li/7Li isotope ratio. The approach presented here can be used by new TOF-SIMS users on their own data for understanding the effects of detector saturation, determine the validity limits of Poisson-based correction, and take into account important considerations when treating the data for quantification purposes.