Elettra-Sincrotrone Trieste: present and future

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Multimodal imaging and spectroscopy like concurrent scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in situ atomic force microscopy (AFM) instrument for operation under high vacuum in a synchrotron soft X-ray microscopy STXM-XRF end-station. A combination of μXRF and AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF-STXM-AFM combination.

Implication of the double-gating mode in a hybrid photon counting detector for measurements of transient heat conduction in GaAs/AlAs superlattice structures

Understanding and control of thermal transport in solids at the nanoscale are crucial in engineering and enhance the properties of a new generation of optoelectronic, thermoelectric and photonic devices. In this regard, semiconductor superlattice structures provide a unique platform to study phenomena associated with phonon propagations in solids such as heat conduction. Transient X-ray diffraction can directly probe atomic motions and therefore is among the rare techniques sensitive to phonon dynamics in condensed matter. Here, optically induced transient heat conduction in GaAs/AlAs superlattice structures is studied using the EIGER2 detector. Benchmark experiments have been performed at the Austrian SAXS beamline at Elettra-Sincrotrone Trieste operated in the hybrid filling mode. This work demonstrates that drifts of experimental conditions, such as synchrotron beam fluctuations, become less essential when utilizing the EIGER2 double-gating mode which results in a faster acquisition of high-quality data and facilitates data analysis and data interpretation.