Investigation of Stereometric and Fractal Patterns of Spin-Coated LuMnO3 Thin Films

Analysing the surface morphology of annealed FTO/ZnS bilayer films: stereometric, fractal, and wettability approaches

The surface micromorphology and roughening of the thermal evaporation-coated FTO/ZnS bilayer thin films annealed at 300, 400, 500, and 550 ∘ C for 1 h have been studied. AFM images of the prepared samples were analysed by the MountainsMap software, and the effects of the annealing temperature on the surface texture of the FTO/ZnS thin film's surface were investigated. Stereometric and advanced fractal analyses showed that the sample annealed at 500 ∘ C exhibited greater surface roughness and greater skewness and kurtosis. This film also has the most isotropic surface and exhibits the highest degree of heterogeneity. Also, despite the decrease in surface roughness with increasing temperature from 500 to 550 ∘ C , the fractal dimension tends to increase. The static water contact angle measurements indicate that the film annealed at 500 ∘ C exhibits higher hydrophobicity, which can be attributed to its greater topographic roughness. Our research indicates that the surface morphology of FTO/ZnS bilayer thin films is influenced by the annealing temperature. Changing factors such as roughness, fractality, and wettability parameters to help improve surface performance make the FTO/ZnS bilayer suitable for application in electronic and solar systems.

Morphological and multifractal properties of Cr thin films deposited onto different substrates

In this study, the morphological properties and micro-roughness of chromium thin film prepared by thermal evaporation technique and confirmed via EDS analysis are examined on different substrates of BK7, Silicon (Si), and glass using atomic force microscope analysis (AFM). Analysis of amplitude parameters, Minkowski functionals, and films' spatial microtexture extracted from AFM analysis showed the difference between glass substrate and the other two (BK7 and Si) substrates for the growth of chromium thin films. In addition, we observed robust signatures of multifractality of the Cr thin films deposited on all substrates we studied. Moreover, we highlight that the Glass substrates displayed the strongest multifractality indicating that such samples present space filling properties distributed over more spatial scales than the samples of BK7 and Si.

Corrigendum to “Investigation of Stereometric and Fractal Patterns of Spin-Coated LuMnO3 Thin Films”

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