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Eftekhari L, Ghasemi M. Analysing the surface morphology of annealed FTO/ZnS bilayer films: stereometric, fractal, and wettability approaches. Sci Rep 2024; 14:14262. [PMID: 38902309 PMCID: PMC11190240 DOI: 10.1038/s41598-024-65118-w] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/03/2024] [Accepted: 06/17/2024] [Indexed: 06/22/2024] Open
Abstract
The surface micromorphology and roughening of the thermal evaporation-coated FTO/ZnS bilayer thin films annealed at 300, 400, 500, and 550 ∘ C for 1 h have been studied. AFM images of the prepared samples were analysed by the MountainsMap software, and the effects of the annealing temperature on the surface texture of the FTO/ZnS thin film's surface were investigated. Stereometric and advanced fractal analyses showed that the sample annealed at 500 ∘ C exhibited greater surface roughness and greater skewness and kurtosis. This film also has the most isotropic surface and exhibits the highest degree of heterogeneity. Also, despite the decrease in surface roughness with increasing temperature from 500 to 550 ∘ C , the fractal dimension tends to increase. The static water contact angle measurements indicate that the film annealed at 500 ∘ C exhibits higher hydrophobicity, which can be attributed to its greater topographic roughness. Our research indicates that the surface morphology of FTO/ZnS bilayer thin films is influenced by the annealing temperature. Changing factors such as roughness, fractality, and wettability parameters to help improve surface performance make the FTO/ZnS bilayer suitable for application in electronic and solar systems.
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Affiliation(s)
- Leila Eftekhari
- Department of Physics, Faculty of Sciences, Bu Ali Sina University, P.O. Box 65174, Hamedan, Iran
| | - Mohsen Ghasemi
- Department of Physics, Faculty of Sciences, Shahrekord University, P.O. Box 115, Shahrekord, Iran.
- Nanotechnology Research Institute, Shahrekord University, Shahrekord, 8818634141, Iran.
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Zelati A, Mardani M, Rezaee S, Matos RS, Pires MA, da Fonseca Filho HD, Das A, Hafezi F, Rad GA, Kumar S, Ţălu Ş. Morphological and multifractal properties of Cr thin films deposited onto different substrates. Microsc Res Tech 2023; 86:157-168. [PMID: 36223516 DOI: 10.1002/jemt.24242] [Citation(s) in RCA: 7] [Impact Index Per Article: 7.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/16/2022] [Revised: 09/07/2022] [Accepted: 09/29/2022] [Indexed: 01/20/2023]
Abstract
In this study, the morphological properties and micro-roughness of chromium thin film prepared by thermal evaporation technique and confirmed via EDS analysis are examined on different substrates of BK7, Silicon (Si), and glass using atomic force microscope analysis (AFM). Analysis of amplitude parameters, Minkowski functionals, and films' spatial microtexture extracted from AFM analysis showed the difference between glass substrate and the other two (BK7 and Si) substrates for the growth of chromium thin films. In addition, we observed robust signatures of multifractality of the Cr thin films deposited on all substrates we studied. Moreover, we highlight that the Glass substrates displayed the strongest multifractality indicating that such samples present space filling properties distributed over more spatial scales than the samples of BK7 and Si.
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Affiliation(s)
- Amir Zelati
- Department of Basic Sciences, Birjand University of Technology, Birjand, Iran
| | - Mohsen Mardani
- Vacuum Technology Research Group, ACECR, Sharif University Branch, Tehran, Iran
| | - Sahar Rezaee
- Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran
| | - Robert S Matos
- Postgraduate Program in Materials Science and Engineering, Federal University of Sergipe, São Cristovão, Brazil
| | - Marcelo A Pires
- Department of Physics, Federal University of Ceará-UFC, Fortaleza, Brazil
| | - Henrique D da Fonseca Filho
- Laboratory of Synthesis of Nanomaterials and Nanoscopy, Physics Department, Federal University of Amazonas-UFAM, Manaus, Brazil
| | - Abhijeet Das
- Centre for Advanced Research, Department of Physics, Rajiv Gandhi University, Doimukh, India
| | - Fatemeh Hafezi
- Vacuum Technology Research Group, ACECR, Sharif University Branch, Tehran, Iran
| | - Ghasem Amraee Rad
- Vacuum Technology Research Group, ACECR, Sharif University Branch, Tehran, Iran
| | - Sanjeev Kumar
- Centre for Advanced Research, Department of Physics, Rajiv Gandhi University, Doimukh, India
| | - Ştefan Ţălu
- The Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca, Cluj-Napoca, Romania
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Corrigendum to “Investigation of Stereometric and Fractal Patterns of Spin-Coated LuMnO3 Thin Films”. ADVANCES IN MATERIALS SCIENCE AND ENGINEERING 2021. [DOI: 10.1155/2021/9839825] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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