1
|
Kumar V, Shukla A, Kaur G, Kharbanda N, Kaliyamoorthy JB, Ghosh HN. Unraveling Defect-Mediated Enhancement of Transient Photoconductivity and Slower Carrier's Mobility Decay in Cu-Doped Cs 2AgBiBr 6 Nanocrystals Using Ultrafast Pump-Probe Spectroscopy. J Phys Chem Lett 2024; 15:6575-6584. [PMID: 38885443 DOI: 10.1021/acs.jpclett.4c01079] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/20/2024]
Abstract
Lead-free double perovskite nanocrystals (A2B'(III)B″(I)X6 NCs) address the instability and toxicity concerns of lead-based counterparts, but their device performance is limited by subpar absorption and unexplored carrier dynamics. Impurity ion doping offers a route to tune electrical conductivity and charge carrier transport. Herein, we synthesized Cu-doped Cs2AgBiBr6 (CABB) nanocrystals using a hot-injection approach and investigated the charge carrier's dynamics through ultrafast pump-probe spectroscopy. Copper introduction into the CABB lattice enhanced absorption in the near-infrared region and introduced sub-band gap defect states in CABB NCs. The transient absorption study revealed a faster bleach decay with increased copper doping, as a result of charge transfer from the conduction band to copper defect states. Also, an optical pump terahertz probe study displays higher photoconductivity and mobility in Cu-doped CABB NCs. Slower mobility decay in Cu-doped systems was attributed to the charge carrier's entrapment at the defect state. These findings suggest that copper-doped CABB is a superior contender for optoelectronic applications over conventional CABB.
Collapse
Affiliation(s)
- Vikas Kumar
- Institute of Nano Science and Technology, Mohali, Punjab 140306, India
| | - Ayushi Shukla
- Institute of Nano Science and Technology, Mohali, Punjab 140306, India
| | - Gurpreet Kaur
- Institute of Nano Science and Technology, Mohali, Punjab 140306, India
| | - Nitika Kharbanda
- Institute of Nano Science and Technology, Mohali, Punjab 140306, India
| | | | - Hirendra N Ghosh
- School of Chemical Sciences, National Institute of Science Education and Research (NISER), Bhubaneswar, Odisha 752050, India
| |
Collapse
|
2
|
Thien GSH, Chan KY, Marlinda AR. The Role of Polymers in Halide Perovskite Resistive Switching Devices. Polymers (Basel) 2023; 15:polym15051067. [PMID: 36904308 PMCID: PMC10007671 DOI: 10.3390/polym15051067] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/10/2023] [Revised: 02/02/2023] [Accepted: 02/10/2023] [Indexed: 02/24/2023] Open
Abstract
Currently, halide perovskites (HPs) are gaining traction in multiple applications, such as photovoltaics and resistive switching (RS) devices. In RS devices, the high electrical conductivity, tunable bandgap, good stability, and low-cost synthesis and processing make HPs promising as active layers. Additionally, the use of polymers in improving the RS properties of lead (Pb) and Pb-free HP devices was described in several recent reports. Thus, this review explored the in-depth role of polymers in optimizing HP RS devices. In this review, the effect of polymers on the ON/OFF ratio, retention, and endurance properties was successfully investigated. The polymers were discovered to be commonly utilized as passivation layers, charge transfer enhancement, and composite materials. Hence, further HP RS improvement integrated with polymers revealed promising approaches to delivering efficient memory devices. Based on the review, detailed insights into the significance of polymers in producing high-performance RS device technology were effectively understood.
Collapse
Affiliation(s)
- Gregory Soon How Thien
- Centre for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, Cyberjaya 63100, Selangor, Malaysia
| | - Kah-Yoong Chan
- Centre for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, Cyberjaya 63100, Selangor, Malaysia
- Correspondence:
| | - Ab Rahman Marlinda
- Nanotechnology and Catalysis Research Centre (NANOCAT), Universiti Malaya, Kuala Lumpur 50603, Malaysia
| |
Collapse
|
3
|
George T, Murugan AV. Improved Performance of the Al 2O 3-Protected HfO 2-TiO 2 Base Layer with a Self-Assembled CH 3NH 3PbI 3 Heterostructure for Extremely Low Operating Voltage and Stable Filament Formation in Nonvolatile Resistive Switching Memory. ACS APPLIED MATERIALS & INTERFACES 2022; 14:51066-51083. [PMID: 36397313 DOI: 10.1021/acsami.2c13478] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
Abstract
Herein, we report intriguing observations of an extremely stable nonvolatile bipolar resistive switching (NVBRS) memory device fabricated using HfO2-TiO2 topologically protected by Al2O3 as a stacked base layer for a CH3NH3PbI3 (MAPI) electrolyte layer sandwiched between Ag and fluorine-doped tin oxide (FTO) electrodes. MAPI has been successfully synthesized by a rapid microwave-solvothermal (MW-ST) method within 10 min at 120 °C without requiring any inert gas atmosphere using low-cost precursors and solvents. Subsequently, MAPI powders are dissolved in aprotic solvents (DMF/DMSO = 8:2), and a spin-coated thin film is allowed to recrystallize upon annealing at 120 °C via a solution-based nanoscale self-assembly process. The fabricated memory device with the Ag/MAPI/Al2O3/TiO2-HfO2/FTO configuration shows an enhanced resistance ratio of 105 for >104 s at an extremely lower operating voltage (SET +0.2 V, RESET -0.2 V) when compared to that of the pristine MAPI device (±1 V, 102, 104 s). We show that the memory device also exhibits a remarkable endurance of ≥3500 cycles due to the Al2O3 robust coating on the HfO2-TiO2 layer, facilitating prompt heterojunction formation. Thus, the adopted innovative strategies to prepare structurally and optically stable (∼1.5 years) MAPI under high-humid conditions could offer enhanced performance of NVBRS memory devices for medical, security, internet of things (IoT), and artificial intelligence (AI) applications.
Collapse
Affiliation(s)
- Twinkle George
- Advanced Functional Nanomaterials Research Laboratory, Centre for Nanoscience and Technology, Madanjeet School of Green Energy Technologies, Pondicherry University (A Central University), Dr. R. Vankataraman Nagar, Kalapet, Puducherry605014, India
| | - Arumugam Vadivel Murugan
- Advanced Functional Nanomaterials Research Laboratory, Centre for Nanoscience and Technology, Madanjeet School of Green Energy Technologies, Pondicherry University (A Central University), Dr. R. Vankataraman Nagar, Kalapet, Puducherry605014, India
| |
Collapse
|
4
|
Thien GH, Ab Rahman M, Yap BK, Tan NML, He Z, Low PL, Devaraj NK, Ahmad Osman AF, Sin YK, Chan KY. Recent Advances in Halide Perovskite Resistive Switching Memory Devices: A Transformation from Lead-Based to Lead-Free Perovskites. ACS OMEGA 2022; 7:39472-39481. [PMID: 36385870 PMCID: PMC9648113 DOI: 10.1021/acsomega.2c03206] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/23/2022] [Accepted: 09/15/2022] [Indexed: 06/16/2023]
Abstract
Due to their remarkable electrical and light absorption characteristics, hybrid organic-inorganic perovskites have recently gained popularity in several applications such as optoelectronics, lasers, and light-emitting diodes. Through this, there has recently been an increase in the use of halide perovskites (HPs) in resistive switching (RS) devices. However, lead-based (Pb-based) perovskites are notorious for being unstable and harmful to the environment. As a result, lead-free (Pb-free) perovskite alternatives are being investigated in achieving the long-term and sustainable use of RS devices. This work describes the characteristics of Pb-based and Pb-free perovskite RS devices. It also presents the recent advancements of HP RS devices, including the selection strategies of perovskite structures. In terms of resistive qualities, the directions of both HPs appear to be identical. Following that, the possible impact of switching from Pb-based to Pb-free HPs is examined to determine the requirement in RS devices. Finally, this work discusses the opportunities and challenges of HP RS devices in creating a stable, efficient, and sustainable memory storage technology.
Collapse
Affiliation(s)
- Gregory
Soon How Thien
- Centre
for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, 63100 Cyberjaya, Selangor, Malaysia
| | - Marlinda Ab Rahman
- Nanotechnology
and Catalysis Research Centre (NANOCAT), Universiti Malaya, 50603 Kuala Lumpur, Malaysia
| | - Boon Kar Yap
- Electronic
and Communications Department, College of Engineering, Universiti Tenaga Nasional, 43000 Kajang, Selangor Malaysia
- Institute
of Sustainable Energy, Universiti Tenaga
Nasional, 43000 Kajang, Selangor, Malaysia
- International
School of Advanced Materials, South China
University of Technology, 381 Wushan Road, Tianhe District, 510640 Guangzhou, Guangdong People’s Republic of China
| | - Nadia Mei Lin Tan
- Key Laboratory
of More Electric Aircraft Technology of Zhejiang Province, University of Nottingham Ningbo China, 315100 Ningbo, People’s Republic of China
- Institute
of Power Engineering, Universiti Tenaga
Nasional, 43000 Kajang, Selangor, Malaysia
| | - Zhicai He
- Institute
of Polymer Optoelectronic Materials and Devices, School of Materials
Science & Engineering, South China University
of Technology, 381 Wushan
Road, Tianhe District, 510640Guangzhou, Guangdong Province People’s Republic of China
| | - Pei-Ling Low
- Centre
for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, 63100 Cyberjaya, Selangor, Malaysia
| | - Nisha Kumari Devaraj
- Centre
for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, 63100 Cyberjaya, Selangor, Malaysia
| | - Ahmad Farimin Ahmad Osman
- Centre
for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, 63100 Cyberjaya, Selangor, Malaysia
| | - Yew-Keong Sin
- Centre
for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, 63100 Cyberjaya, Selangor, Malaysia
| | - Kah-Yoong Chan
- Centre
for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Persiaran Multimedia, 63100 Cyberjaya, Selangor, Malaysia
| |
Collapse
|
5
|
Wang K, Liu J, El-Khouly ME, Cui X, Che Q, Zhang B, Chen Y. Water-Soluble Polythiophene-Conjugated Polyelectrolyte-Based Memristors for Transient Electronics. ACS APPLIED MATERIALS & INTERFACES 2022; 14:36987-36997. [PMID: 35943132 DOI: 10.1021/acsami.2c04752] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
The key to protect sensitive information stored in electronic memory devices from disclosure is to develop transient electronic devices that are capable of being destroyed quickly in an emergency. By using a highly water-soluble polythiophene-conjugated polyelectrolyte PTT-NMI+Br- as an active material, which was synthesized by the reaction of poly[thiophene-alt-4,4-bis(6-bromohexyl)-4H-cyclopenta(1,2-b:5,4-b')dithiophene] with N-methylimidazole, a flexible electronic device, Al/PTT-NMI+Br-/ITO-coated PET (ITO: indium tin oxide; PET: polyethylene terephthalate), is successfully fabricated. This device shows a typical nonvolatile rewritable resistive random access memory (RRAM) effect at a sweep voltage range of ±3 V and a history-dependent memristive switching performance at a small sweep voltage range of ±1 V. Both the learning/memorizing functions and the synaptic potentiation/depression of biological systems have been emulated. The switching mechanism for the PTT-NMI+Br--based electronic device may be highly associated with ion migration under bias. Once water is added to this device, it will be destructed rapidly within 20 s due to the dissolution of the active layer. This device is not only a typical transient device but can also be used for constructing conventional memristors with long-term stability after electronic packaging. Furthermore, the soluble active layer in the device can be easily recycled from its aqueous solution and reused for fabricating new transient memristors. This work offers a train of new thoughts for designing and constructing a neuromorphic computing system that can be quickly destroyed with water in the near future.
Collapse
Affiliation(s)
- Kexin Wang
- Key Laboratory for Advanced Materials and Joint International Research Laboratory of Precision Chemistry and Molecular Engineering, Feringa Nobel Prize Scientist Joint Research Center, School of Chemistry and Molecular Engineering, East China University of Science and Technology, 130 Meilong Road, Shanghai 200237, China
| | - Jiaxuan Liu
- Key Laboratory for Advanced Materials and Joint International Research Laboratory of Precision Chemistry and Molecular Engineering, Feringa Nobel Prize Scientist Joint Research Center, School of Chemistry and Molecular Engineering, East China University of Science and Technology, 130 Meilong Road, Shanghai 200237, China
| | - Mohamed E El-Khouly
- Institute of Basic and Applied Sciences, Egypt-Japan University of Science and Technology (E-JUST), Alexandria 21934, Egypt
| | - Xiaosheng Cui
- Shanghai Institute of Space Propulsion, 801 Minhang Wanfang Road, Shanghai 201112, China
| | - Qiang Che
- Key Laboratory for Advanced Materials and Joint International Research Laboratory of Precision Chemistry and Molecular Engineering, Feringa Nobel Prize Scientist Joint Research Center, School of Chemistry and Molecular Engineering, East China University of Science and Technology, 130 Meilong Road, Shanghai 200237, China
| | - Bin Zhang
- Key Laboratory for Advanced Materials and Joint International Research Laboratory of Precision Chemistry and Molecular Engineering, Feringa Nobel Prize Scientist Joint Research Center, School of Chemistry and Molecular Engineering, East China University of Science and Technology, 130 Meilong Road, Shanghai 200237, China
| | - Yu Chen
- Key Laboratory for Advanced Materials and Joint International Research Laboratory of Precision Chemistry and Molecular Engineering, Feringa Nobel Prize Scientist Joint Research Center, School of Chemistry and Molecular Engineering, East China University of Science and Technology, 130 Meilong Road, Shanghai 200237, China
| |
Collapse
|
6
|
Zhong T, Qin Y, Lv F, Qin H, Tian X. Correction to: Light-Activated Multilevel Resistive Switching Storage in Pt/Cs 2AgBiBr 6/ITO/Glass Devices. NANOSCALE RESEARCH LETTERS 2022; 17:10. [PMID: 35020081 PMCID: PMC8755861 DOI: 10.1186/s11671-022-03659-7] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
An amendment to this paper has been published and can be accessed via a link at the top of the paper.
Collapse
Affiliation(s)
- Tingting Zhong
- School of Physical Science and Technology and Guangxi Key Laboratory of Nuclear Physics and Technology, Guangxi Normal University, Yucai Road, Guilin, 541000, China
| | - Yongfu Qin
- School of Physical Science and Technology and Guangxi Key Laboratory of Nuclear Physics and Technology, Guangxi Normal University, Yucai Road, Guilin, 541000, China
| | - Fengzhen Lv
- School of Physical Science and Technology and Guangxi Key Laboratory of Nuclear Physics and Technology, Guangxi Normal University, Yucai Road, Guilin, 541000, China.
| | - Haijun Qin
- School of Physical Science and Technology and Guangxi Key Laboratory of Nuclear Physics and Technology, Guangxi Normal University, Yucai Road, Guilin, 541000, China
| | - Xuedong Tian
- School of Physical Science and Technology and Guangxi Key Laboratory of Nuclear Physics and Technology, Guangxi Normal University, Yucai Road, Guilin, 541000, China
| |
Collapse
|