|
1
|
Affiliation(s)
- Anh Tuan Bui
- Department of Statistical Sciences and Operations Research, Virginia Commonwealth University, Richmond, VA
| | - Daniel W. Apley
- Department of Industrial Engineering & Management Sciences, Northwestern University, Evanston, IL
| |
Collapse
|
|
2
|
A Digital Twin for Automated Root-Cause Search of Production Alarms Based on KPIs Aggregated from IoT. APPLIED SCIENCES-BASEL 2020. [DOI: 10.3390/app10072377] [Citation(s) in RCA: 16] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
Abstract
A dashboard application is proposed and developed to act as a Digital Twin that would indicate the Measured Value to be held accountable for any future failures. The current study describes a method for the exploitation of historical data that are related to production performance and aggregated from IoT, to eliciting the future behavior of the production, while indicating the measured values that are responsible for negative production performance, without training. The dashboard is implemented in the Java programming language, while information is stored into a Database that is aggregated by an Online Analytical Processing (OLAP) server. This achieves easy Key Performance Indicators (KPIs) visualization through the dashboard. Finally, indicative cases of a simulated transfer line are presented and numerical examples are given for validation and demonstration purposes. The need for human intervention is pointed out.
Collapse
|
|
3
|
Bui AT, Apley DW. An exploratory analysis approach for understanding variation in stochastic textured surfaces. Comput Stat Data Anal 2019. [DOI: 10.1016/j.csda.2019.01.019] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
|
|
4
|
Shinozaki N, Iida T. A variable selection method for detecting abnormality based on the T2 test. COMMUN STAT-THEOR M 2017. [DOI: 10.1080/03610926.2016.1185120] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/21/2022]
Affiliation(s)
- N. Shinozaki
- Faculty of Science and Technology, Keio University, Hoyoshi, Kohoku-ku, Yokohama, Japan
| | - T. Iida
- Faculty of Science and Technology, Keio University, Hoyoshi, Kohoku-ku, Yokohama, Japan
| |
Collapse
|
|
5
|
Affiliation(s)
- Zhenyu Shi
- Department of Industrial Engineering & Management Sciences Northwestern University Evanston, IL 60208-3119
| | - Daniel W. Apley
- Department of Industrial Engineering & Management Sciences Northwestern University Evanston, IL 60208-3119
| | - George C. Runger
- School of Computing, Informatics, and Decision Systems Engineerings Arizona State University Tempe, AZ 85287
| |
Collapse
|
|
6
|
Apley DW. Posterior Distribution Charts: A Bayesian Approach for Graphically Exploring a Process Mean. Technometrics 2012. [DOI: 10.1080/00401706.2012.694722] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/28/2022]
|
|
7
|
Mason RL, Chou YM, Young JC. Decomposition of Scatter Ratios Used in Monitoring Multivariate Process Variability. COMMUN STAT-THEOR M 2010. [DOI: 10.1080/03610920902994172] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/19/2022]
|
|
8
|
Yu J, Qin SJ. Variance component analysis based fault diagnosis of multi-layer overlay lithography processes. ACTA ACUST UNITED AC 2009. [DOI: 10.1080/07408170902789076] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/20/2022]
|
|
9
|
|
|
10
|
Zeng L, Jin N, Zhou S. Multiple fault signature integration and enhancing for variation source identification in manufacturing processes. ACTA ACUST UNITED AC 2008. [DOI: 10.1080/07408170801961404] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/21/2022]
Affiliation(s)
- Li Zeng
- a Department of Industrial and Systems Engineering , University of Wisconsin , Madison , WI , 53706 , USA
| | - Nong Jin
- a Department of Industrial and Systems Engineering , University of Wisconsin , Madison , WI , 53706 , USA
| | - Shiyu Zhou
- a Department of Industrial and Systems Engineering , University of Wisconsin , Madison , WI , 53706 , USA
| |
Collapse
|
|
11
|
|
|
12
|
Li Z, Zhou S, Ding Y. Pattern matching for variation-source identification in manufacturing processes in the presence of unstructured noise. ACTA ACUST UNITED AC 2007. [DOI: 10.1080/07408170600735546] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
|
|
13
|
Chen Y. Application of Matroid Theory for Diagnosability Study of Coordinate Sensing Systems in Discrete-Part Manufacturing Processes. Technometrics 2006. [DOI: 10.1198/004017006000000057] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
|
|
14
|
Mandroli SS, Shrivastava AK, Ding Y. A survey of inspection strategy and sensor distribution studies in discrete-part manufacturing processes. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/07408170500327352] [Citation(s) in RCA: 56] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
|
|
15
|
Zhou S, Ding Y, Chen Y, Shi J. Diagnosability Study of Multistage Manufacturing Processes Based on Linear Mixed-Effects Models. Technometrics 2003. [DOI: 10.1198/004017003000000131] [Citation(s) in RCA: 97] [Impact Index Per Article: 4.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
|
|
16
|
Apley DW, Lee HY. Identifying Spatial Variation Patterns in Multivariate Manufacturing Processes. Technometrics 2003. [DOI: 10.1198/004017003000000041] [Citation(s) in RCA: 35] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
|